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Worst Case-Induced Disturbances in Microstrip Interchip Interconnects by an External Electromagnetic Plane Wave - Part II: Analysis and Validation
2011 LAGOS BENITES, JORGE LUIS; Fiori, Franco
Worst-Case Induced Disturbances in Digital and Analog Interchip Interconnects by an External Electromagnetic Plane Wave - Part I: Modeling and Algorithm
2011 LAGOS BENITES, JORGE LUIS; Fiori, Franco
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Worst Case-Induced Disturbances in Microstrip Interchip Interconnects by an External Electromagnetic Plane Wave - Part II: Analysis and Validation / LAGOS BENITES, JORGE LUIS; Fiori, Franco. - In: IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. - ISSN 0018-9375. - STAMPA. - 53:2(2011), pp. 491-500. [10.1109/TEMC.2010.2089566] | 1-gen-2011 | LAGOS BENITES, JORGE LUISFIORI, Franco | - |
| Worst-Case Induced Disturbances in Digital and Analog Interchip Interconnects by an External Electromagnetic Plane Wave - Part I: Modeling and Algorithm / LAGOS BENITES, JORGE LUIS; Fiori, Franco. - In: IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. - ISSN 0018-9375. - STAMPA. - 53:1(2011), pp. 178-184. [10.1109/TEMC.2010.2085005] | 1-gen-2011 | LAGOS BENITES, JORGE LUISFIORI, Franco | - |