This paper presents a versatile readout system for particle detector front-end ASICs based on the AMD Zynq Ultrascale+ System-on-Chips. The system is suitable for both extensive laboratory characterization and for data acquisition at test beam facilities. Its software-level scripting of the test procedure reduces the firmware development effort, maximizing the system reusability among different DUTs. At the same time, the integration with High-Level Synthesis flows allows the deployment of real-time data processing algorithms in hardware, offloading the ARM processor. The system has been tested in different use cases, including the mixed-signal data acquisition from monolithic CMOS sensors for timing applications at test beam facilities and the readout of CMOS sensors for tracking and tomographic imaging.

A versatile readout system for front-end ASICs with HLS-based hardware-accelerated processing capabilities / Pagliarino, Valerio; Bortone, Alberto; Falchieri, Davide; Follo, Umberto; Petrini, Emanuela; Rivetti, Angelo; Dionisio Da Rocha Rolo, Manuel; Zugravel, Stefan Cristi. - In: JOURNAL OF INSTRUMENTATION. - ISSN 1748-0221. - 21:01(2026). [10.1088/1748-0221/21/01/C01047]

A versatile readout system for front-end ASICs with HLS-based hardware-accelerated processing capabilities

Valerio Pagliarino;Umberto Follo;Stefan Cristi Zugravel
2026

Abstract

This paper presents a versatile readout system for particle detector front-end ASICs based on the AMD Zynq Ultrascale+ System-on-Chips. The system is suitable for both extensive laboratory characterization and for data acquisition at test beam facilities. Its software-level scripting of the test procedure reduces the firmware development effort, maximizing the system reusability among different DUTs. At the same time, the integration with High-Level Synthesis flows allows the deployment of real-time data processing algorithms in hardware, offloading the ARM processor. The system has been tested in different use cases, including the mixed-signal data acquisition from monolithic CMOS sensors for timing applications at test beam facilities and the readout of CMOS sensors for tracking and tomographic imaging.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/3007090