This paper proposes a true random number generator (TRNG) based on a successive approximation register (SAR) analog-to-digital converter (ADC). A top-plate sampling SAR ADC structure and a new MSB-isolation switch scheme (MISS) are combined to achieve low-power operation and small area occupancy at the same time. When the SAR ADC has completed its conversion, a secondary firing of the comparator measures the remaining signal. This 1-bit quantized residue serves as the true random sequence, thus eliminating the need for extra circuitry in the TRNG. A 65-nm prototype of the proposed TRNG was found to occupy an area of 0.012 mm2 and successfully passed all the National Institute of Standards and Technology (NIST) tests without post-processing. It achieved a figure-of-merit of 0.244 pJ/bit for a 1 Mb/s random sequence with a 0.8-V power supply. Its resilience to power noise injection attacks was also verified.
A 0.012-mm2 0.244-pJ/bit successive approximation register analog-to-digital converter-based true random number generator for Internet of Things applications in a 65-nm complementary metal–oxide–semiconductor / Kai, Cheng; Yong, Chen; Crovetti, PAOLO STEFANO; Rui P, Martins; Pui-In, Mak. - In: INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS. - ISSN 0098-9886. - STAMPA. - (2024). [10.1002/cta.4065]
A 0.012-mm2 0.244-pJ/bit successive approximation register analog-to-digital converter-based true random number generator for Internet of Things applications in a 65-nm complementary metal–oxide–semiconductor
Paolo Stefano Crovetti;
2024
Abstract
This paper proposes a true random number generator (TRNG) based on a successive approximation register (SAR) analog-to-digital converter (ADC). A top-plate sampling SAR ADC structure and a new MSB-isolation switch scheme (MISS) are combined to achieve low-power operation and small area occupancy at the same time. When the SAR ADC has completed its conversion, a secondary firing of the comparator measures the remaining signal. This 1-bit quantized residue serves as the true random sequence, thus eliminating the need for extra circuitry in the TRNG. A 65-nm prototype of the proposed TRNG was found to occupy an area of 0.012 mm2 and successfully passed all the National Institute of Standards and Technology (NIST) tests without post-processing. It achieved a figure-of-merit of 0.244 pJ/bit for a 1 Mb/s random sequence with a 0.8-V power supply. Its resilience to power noise injection attacks was also verified.File | Dimensione | Formato | |
---|---|---|---|
Circuit Theory Apps - 2024 - Cheng - A 0 012‐mm2 0 244‐pJ bit successive approximation register analog‐to‐digital.pdf
accesso riservato
Descrizione: post-print editoriale
Tipologia:
2a Post-print versione editoriale / Version of Record
Licenza:
Non Pubblico - Accesso privato/ristretto
Dimensione
7.17 MB
Formato
Adobe PDF
|
7.17 MB | Adobe PDF | Visualizza/Apri Richiedi una copia |
Pubblicazioni consigliate
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
https://hdl.handle.net/11583/2990117