Refractory transition metal nitrides and oxynitrides are of interest for plasmonic applications due to their increased thermal stability, tunability and comparatively low loss. Presented here is an experimental investigation of reactively sputtered niobium oxynitride thin films, demonstrating screened plasma wavelengths tunable over a similar to 90 nm spectral range. The optical response is correlated with resistivity and Hall measurements. Additionally, an explanation is provided for the double epsilon-near-zero (2ENZ) behavior observed and it is compared with other material systems. Experimental analysis of film composition and structure are combined with computational modelling, based on density functional theory, to explain the dispersion behavior observed and indicate that 2ENZ behavior arises due to the incorporation of oxygen within the films during deposition.

Tunable double epsilon-near-zero behavior in niobium oxynitride thin films / Bower, R.; Wells, M. P.; Johnson, F.; Kilmurray, R.; Doiron, B.; Cali', E.; Mallia, G.; Zou, B.; Mihai, A. P.; Harrison, N. M.; Fearn, S.; Oulton, R.; Alford, N. M.; Cohen, L. F.; Petrov, P. K.. - In: APPLIED SURFACE SCIENCE. - ISSN 0169-4332. - 569:(2021). [10.1016/j.apsusc.2021.150912]

Tunable double epsilon-near-zero behavior in niobium oxynitride thin films

Cali' E.;
2021

Abstract

Refractory transition metal nitrides and oxynitrides are of interest for plasmonic applications due to their increased thermal stability, tunability and comparatively low loss. Presented here is an experimental investigation of reactively sputtered niobium oxynitride thin films, demonstrating screened plasma wavelengths tunable over a similar to 90 nm spectral range. The optical response is correlated with resistivity and Hall measurements. Additionally, an explanation is provided for the double epsilon-near-zero (2ENZ) behavior observed and it is compared with other material systems. Experimental analysis of film composition and structure are combined with computational modelling, based on density functional theory, to explain the dispersion behavior observed and indicate that 2ENZ behavior arises due to the incorporation of oxygen within the films during deposition.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2990038