Optimization of thin film deposition is often the limiting step in the discovery of new materials and device development. Over the years, high-throughput combinatorial methods were developed for the deposition of thin films from the gas phase. However, very few reports focused on combinatorial thin film deposition from solution. Here, we introduce a combinatorial approach for the deposition of thin films from solution. The flow deposition setup allows for simultaneously studying the effect of two critical parameters, deposition time and deposition temperature, on a single sample. As a proof of concept, we demonstrate the solution deposition of PbS thin films, which resulted in a library of 25 deposition condition combinations on a single GaAs (100) substrate. X-ray diffraction and scanning electron microscopy combined with focused ion beam cross-sectional sample preparation confirmed the formation of high-quality PbS films and showed the morphology evolution as a function of these two deposition parameters. This method can be easily adapted for cost-effective and rapid combinatorial studies of a large variety of solution-deposited thin film materials.

A Combinatorial Approach for the Solution Deposition of Thin Films / Zakay, Noy; Lombardo, Luca; Maman, Nitzan; Parvis, Marco; Vradman, Leonid; Golan, Yuval. - In: ACS APPLIED ENGINEERING MATERIALS. - ISSN 2771-9545. - ELETTRONICO. - 1:5(2023), pp. 1367-1374. [10.1021/acsaenm.3c00072]

A Combinatorial Approach for the Solution Deposition of Thin Films

Lombardo, Luca;Parvis, Marco;
2023

Abstract

Optimization of thin film deposition is often the limiting step in the discovery of new materials and device development. Over the years, high-throughput combinatorial methods were developed for the deposition of thin films from the gas phase. However, very few reports focused on combinatorial thin film deposition from solution. Here, we introduce a combinatorial approach for the deposition of thin films from solution. The flow deposition setup allows for simultaneously studying the effect of two critical parameters, deposition time and deposition temperature, on a single sample. As a proof of concept, we demonstrate the solution deposition of PbS thin films, which resulted in a library of 25 deposition condition combinations on a single GaAs (100) substrate. X-ray diffraction and scanning electron microscopy combined with focused ion beam cross-sectional sample preparation confirmed the formation of high-quality PbS films and showed the morphology evolution as a function of these two deposition parameters. This method can be easily adapted for cost-effective and rapid combinatorial studies of a large variety of solution-deposited thin film materials.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2982757