We propose a method to analyze the performance variability caused by fabrication uncertainty in photonic circuits with a large number of correlated parameters. By combining a sparse polynomial chaos expansion model with dimensionality reduction in the form of Karhunen-Loève transform and principal component analysis, we demonstrate the stochastic analysis of the transfer function of cascaded Mach-Zehnder interferometers with up to 38 correlated uncertain parameters.
Performance Variability Analysis of Photonic Circuits with Many Correlated Parameters / Waqas, A.; Manfredi, P.; Melati, D.. - In: JOURNAL OF LIGHTWAVE TECHNOLOGY. - ISSN 0733-8724. - STAMPA. - 39:14(2021), pp. 4737-4744. [10.1109/JLT.2021.3076023]
Performance Variability Analysis of Photonic Circuits with Many Correlated Parameters
Manfredi P.;
2021
Abstract
We propose a method to analyze the performance variability caused by fabrication uncertainty in photonic circuits with a large number of correlated parameters. By combining a sparse polynomial chaos expansion model with dimensionality reduction in the form of Karhunen-Loève transform and principal component analysis, we demonstrate the stochastic analysis of the transfer function of cascaded Mach-Zehnder interferometers with up to 38 correlated uncertain parameters.File | Dimensione | Formato | |
---|---|---|---|
JLWT___Sparse_PCE___PCA.pdf
accesso aperto
Tipologia:
2. Post-print / Author's Accepted Manuscript
Licenza:
PUBBLICO - Tutti i diritti riservati
Dimensione
800.83 kB
Formato
Adobe PDF
|
800.83 kB | Adobe PDF | Visualizza/Apri |
jnl-2021-JLT.pdf
non disponibili
Tipologia:
2a Post-print versione editoriale / Version of Record
Licenza:
Non Pubblico - Accesso privato/ristretto
Dimensione
1.58 MB
Formato
Adobe PDF
|
1.58 MB | Adobe PDF | Visualizza/Apri Richiedi una copia |
Pubblicazioni consigliate
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
https://hdl.handle.net/11583/2921952