Archivio Istituzionale della RicercaThe articles in this special section were presented at the 2019 IEEE VLSI Test Symposium (VTS) that was held in Monterey, CA. The 2019 VTS Conference laid particular emphasis on enlarging its scope by soliciting submissions on testing, reliability, and security aspects on the following hot topics: approximate computing, neuromorphic computing, and quantum computing.
Guest Editors' Introduction: Selected Papers from IEEE VLSI Test Symposium / Di Carlo, Stefano; Song, Peilin; Chickermane, Vivek. - In: IEEE DESIGN & TEST. - ISSN 2168-2356. - STAMPA. - 37:4(2020), pp. 5-6. [10.1109/MDAT.2020.2998440]
Guest Editors' Introduction: Selected Papers from IEEE VLSI Test Symposium
Di Carlo, Stefano;
2020
Abstract
The articles in this special section were presented at the 2019 IEEE VLSI Test Symposium (VTS) that was held in Monterey, CA. The 2019 VTS Conference laid particular emphasis on enlarging its scope by soliciting submissions on testing, reliability, and security aspects on the following hot topics: approximate computing, neuromorphic computing, and quantum computing.
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