Electromagnetic devices may be affected by the presence of local losses due to material defects or magnetic anomalies caused by mechanical processing. The localization of such defects is the main goal of this article; a noninvasive method has been pursued to perform the inspection and detection of imperfections or defects. The adopted approach is based on the observation of the device under test with a high-speed IR camera; no limitations in size and shapes devices are considered and the method can be widely adopted. Examples of defects detection in the magnetic circuit realization are proposed, both for traditional ferromagnetic laminated sheets and for soft magnetic composites.
|Titolo:||A Novel Thermographic Method and Its Improvement to Evaluate Defects in Laminated and Soft Magnetic Composites Devices|
|Data di pubblicazione:||2019|
|Digital Object Identifier (DOI):||10.1109/TIA.2019.2933801|
|Appare nelle tipologie:||1.1 Articolo in rivista|
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