A new alkali-containing diopside based glass-ceramic sealant for solid oxide cells was synthesized, characterized and tested. The composition was designed to match the coefficient of thermal expansion (CTE) of Crofer22APU interconnect. The sealant has a glass transition temperature of 600 °C, a crystallization peak temperature of 850 °C and a maximum shrinkage temperature of 700 °C, thus suggesting effective densification prior to crystallization. The CTE of the glass-ceramic is 11.5 10−6 K−1, a value which is compatible with the CTE for Crofer22APU stainless steel. Crofer22APU/glass-ceramic/Crofer22APU joined samples were tested in simulated real-life operating conditions at 800 °C in dual atmosphere under an applied voltage, monitoring the electrical resistivity. The effect of two different applied voltages (0.7 V and 1.3 V) was evaluated. A voltage of 1.3 V led to a rapid decrease in the electrical resistivity during the test; such a drop was due to the formation of Cr2O3 “bridges” that connected the two Crofer22APU plates separated by the sealant. There was no decrease in the resistivity when a voltage of 0.7 V was applied. Instead, resistivity value remained stable at around 105 Ω cm for the 100 h test duration. The degradation mechanisms, due to both the alkali content and the applied voltage, are investigated and discussed.

Effect of electric load and dual atmosphere on the properties of an alkali containing diopside-based glass sealant for solid oxide cells / Sabato, A. G.; Rost, A.; Schilm, J.; Kusnezoff, M.; Salvo, M.; Chrysanthou, A.; Smeacetto, F.. - In: JOURNAL OF POWER SOURCES. - ISSN 0378-7753. - 415:(2019), pp. 15-24. [10.1016/j.jpowsour.2019.01.051]

Effect of electric load and dual atmosphere on the properties of an alkali containing diopside-based glass sealant for solid oxide cells

Sabato, A. G.;Salvo, M.;Smeacetto, F.
2019

Abstract

A new alkali-containing diopside based glass-ceramic sealant for solid oxide cells was synthesized, characterized and tested. The composition was designed to match the coefficient of thermal expansion (CTE) of Crofer22APU interconnect. The sealant has a glass transition temperature of 600 °C, a crystallization peak temperature of 850 °C and a maximum shrinkage temperature of 700 °C, thus suggesting effective densification prior to crystallization. The CTE of the glass-ceramic is 11.5 10−6 K−1, a value which is compatible with the CTE for Crofer22APU stainless steel. Crofer22APU/glass-ceramic/Crofer22APU joined samples were tested in simulated real-life operating conditions at 800 °C in dual atmosphere under an applied voltage, monitoring the electrical resistivity. The effect of two different applied voltages (0.7 V and 1.3 V) was evaluated. A voltage of 1.3 V led to a rapid decrease in the electrical resistivity during the test; such a drop was due to the formation of Cr2O3 “bridges” that connected the two Crofer22APU plates separated by the sealant. There was no decrease in the resistivity when a voltage of 0.7 V was applied. Instead, resistivity value remained stable at around 105 Ω cm for the 100 h test duration. The degradation mechanisms, due to both the alkali content and the applied voltage, are investigated and discussed.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2730376
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