This paper deals with uncertainty propagation applied to the analysis of crosstalk in printed circuit board microstrip traces. Complex interconnection networks generally are affected by many uncertain parameters and their point-to-point transfer functions are computationally expensive, thus making Monte-Carlo analyses rather inefficient. To overcome this situation, a metamodel is highly desirable. This paper presents a sparse and accelerated polynomial chaos approach, which proves to be well adapted for high-dimensional uncertainty quantification and well suited for the sensitivity analysis of crosstalk effects. We highlight the significant advantage of the advocated approach for the design of microstrip line networks of complex topology. In fact, we demonstrate how a small number of system simulations can help to quantify the statistics of the output variability and identify a reduced set of high-impact parameters.

IDENTFICATION OF MAIN FACTORS OF UNCERTAINTY IN A MICROSTRIP LINE NETWORK / Larbi, M.; Stievano, I. S.; Canavero, F. G.; Besnier, P.. - In: ELECTROMAGNETIC WAVES. - ISSN 1070-4698. - ELETTRONICO. - 162:(2018), pp. 61-72. [10.2528/PIER18040607]

IDENTFICATION OF MAIN FACTORS OF UNCERTAINTY IN A MICROSTRIP LINE NETWORK

I. S. Stievano;F. G. Canavero;
2018

Abstract

This paper deals with uncertainty propagation applied to the analysis of crosstalk in printed circuit board microstrip traces. Complex interconnection networks generally are affected by many uncertain parameters and their point-to-point transfer functions are computationally expensive, thus making Monte-Carlo analyses rather inefficient. To overcome this situation, a metamodel is highly desirable. This paper presents a sparse and accelerated polynomial chaos approach, which proves to be well adapted for high-dimensional uncertainty quantification and well suited for the sensitivity analysis of crosstalk effects. We highlight the significant advantage of the advocated approach for the design of microstrip line networks of complex topology. In fact, we demonstrate how a small number of system simulations can help to quantify the statistics of the output variability and identify a reduced set of high-impact parameters.
File in questo prodotto:
File Dimensione Formato  
jnl-2018-PIERS-PC-online.pdf

accesso aperto

Descrizione: jnl-2018-PIERS-PC-online
Tipologia: 2a Post-print versione editoriale / Version of Record
Licenza: PUBBLICO - Tutti i diritti riservati
Dimensione 396.74 kB
Formato Adobe PDF
396.74 kB Adobe PDF Visualizza/Apri
Pubblicazioni consigliate

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2715074
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo