We investigate the microscopic mechanism responsible for the change of macroscopic electrical properties of the Bi2Sr2CaCu2O8+δ high-temperature superconductor induced by intense synchrotron hard x-ray beams. The possible effects of secondary electrons on the oxygen content via the knock-on interaction are studied by Monte Carlo simulations. The change in the oxygen content expected from the knock-on model is computed convoluting the fluence of photogenerated electrons in the material with the Seitz-Koehler cross section. This approach has been adopted to analyze several experimental irradiation sessions with increasing x-ray fluences. A close comparison between the expected variations in oxygen content and the experimental results allows determining the irradiation regime in which the knock-on mechanism can satisfactorily explain the observed changes. Finally, we estimate the threshold displacement energy of loosely bound oxygen atoms in this material Td=0.15(+0.025−0.01)eV.
Monte Carlo analysis of the oxygen knock-on effects induced by synchrotron x-ray radiation in the Bi2Sr2CaCu2O8+δ superconductor / Torsello, Daniele; Mino, Lorenzo; Bonino, Valentina; Agostino, Angelo; Operti, Lorenza; Borfecchia, Elisa; Vittone, Ettore; Lamberti, Carlo; Truccato, Marco. - In: PHYSICAL REVIEW MATERIALS. - ISSN 2475-9953. - ELETTRONICO. - 2:1(2018), pp. 014801-014808.
|Titolo:||Monte Carlo analysis of the oxygen knock-on effects induced by synchrotron x-ray radiation in the Bi2Sr2CaCu2O8+δ superconductor|
|Data di pubblicazione:||2018|
|Digital Object Identifier (DOI):||http://dx.doi.org/10.1103/PhysRevMaterials.2.014801|
|Appare nelle tipologie:||1.1 Articolo in rivista|