The field of Large-Scale Metrology has been studied extensively for many decades and represents the combination and competition of topics as diverse as geodesy and laboratory calibration. A primary reason that Large-Scale Metrology continues to represent the research frontier is that technological advances introduced and perfected at a conventional scale face additional challenges which increase non-linearly with size. This necessitates new ways of considering the entire measuring process, resulting in the application of concepts such as virtual measuring processes and cyber-physical systems. This paper reports on the continuing evolution of Large-Scale Metrology.
Advances in Large-Scale Metrology – Review and future trends / Schmitt, R. H.; Peterek, M.; Morse, E.; Knapp, W.; Galetto, Maurizio; Härtig, F.; Goch, G.; Hughes, B.; Forbes, A.; Estler, W. T.. - In: CIRP ANNALS. - ISSN 0007-8506. - STAMPA. - 65:2(2016), pp. 643-665. [10.1016/j.cirp.2016.05.002]
Advances in Large-Scale Metrology – Review and future trends
GALETTO, Maurizio;
2016
Abstract
The field of Large-Scale Metrology has been studied extensively for many decades and represents the combination and competition of topics as diverse as geodesy and laboratory calibration. A primary reason that Large-Scale Metrology continues to represent the research frontier is that technological advances introduced and perfected at a conventional scale face additional challenges which increase non-linearly with size. This necessitates new ways of considering the entire measuring process, resulting in the application of concepts such as virtual measuring processes and cyber-physical systems. This paper reports on the continuing evolution of Large-Scale Metrology.File | Dimensione | Formato | |
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CIRP V.65 N.2 2016, pp.643-665.pdf
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https://hdl.handle.net/11583/2649806
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