A digital-based, process-supply-and-temperature independent voltage reference suitable to nanoscale CMOS technologies, which exploits the recently proposed ‘virtual reference’ concept to achieve a very low thermal drift, is presented. Its performance is assessed on the basis of simulations and experiments carried out on a microcontroller-based, proof-of-concept prototype and is compared with state-of-the-art integrated analogue and digital voltage references. A simulated (measured) thermal drift as low as 1 ppm/°C (5 ppm/°C) in the temperature range −40/+140°C (−10/+100°C) is reported.
|Titolo:||Very low thermal drift precision virtual voltage reference|
|Data di pubblicazione:||2015|
|Digital Object Identifier (DOI):||10.1049/el.2015.1209|
|Appare nelle tipologie:||1.1 Articolo in rivista|