Measurements of the dimensionless figure of merit of different thermoelectric devices are presented and discussed, as obtained with a prototype zT meter which is based on the porcupine method. The instrument's architecture and operation are discussed to support claims made on the accuracy of results. Different types of thermoelectric devices were tested, focusing on the size of the porcupine's snout for each. The latter is probably the major source of uncertainty in Harman methods, but is well measurable with the porcupine method, which therefore allows de®nition of the correction needed to obtain accurate evaluation of zT. Accuracies much better than 1% in the determination of the dimensionless figure of merit and series resistance are possible in this way. A survey of various devices is reported, and results are shown to indicate that corrections up to the 10% level and more are needed, depending on the configuration.

A novel zT meter based on the porcupine method and a survey on the size of the snout correction needed for various thermolectric devices / DE MARCHI, Andrea; Giaretto, Valter; Caron, S.; Tona, Andrea. - In: JOURNAL OF ELECTRONIC MATERIALS. - ISSN 0361-5235. - STAMPA. - 42:9(2013), pp. 2067-2072. [10.1007/s11664-013-2530-2]

A novel zT meter based on the porcupine method and a survey on the size of the snout correction needed for various thermolectric devices

DE MARCHI, ANDREA;GIARETTO, Valter;TONA, ANDREA
2013

Abstract

Measurements of the dimensionless figure of merit of different thermoelectric devices are presented and discussed, as obtained with a prototype zT meter which is based on the porcupine method. The instrument's architecture and operation are discussed to support claims made on the accuracy of results. Different types of thermoelectric devices were tested, focusing on the size of the porcupine's snout for each. The latter is probably the major source of uncertainty in Harman methods, but is well measurable with the porcupine method, which therefore allows de®nition of the correction needed to obtain accurate evaluation of zT. Accuracies much better than 1% in the determination of the dimensionless figure of merit and series resistance are possible in this way. A survey of various devices is reported, and results are shown to indicate that corrections up to the 10% level and more are needed, depending on the configuration.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2544736
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