A detailed analysis of the optical and transport properties of semiconductor superlattices in the high-field regime is presented. Electronic Bloch oscillations and the resulting terahertz emission signals are computed including phonon damping in the presence of the electric field. The modifications of the phonon-induced terahertz signal decay are analyzed including the movement of the carriers in the field (intracollisional field effect). For elevated fields it is shown that the interplay between electric field and electron-phonon interaction leads to resonance structures in the terahertz damping rate.
Microscopic theory of the intracollisional field effect in semiconductor superlattices / Hader, J.; Meier, T.; Koch, S. W.; Rossi, Fausto; Linder, N.. - In: PHYSICAL REVIEW. B, CONDENSED MATTER. - ISSN 0163-1829. - 55:20(1997), pp. 13799-13807. [10.1103/PhysRevB.55.13799]
Microscopic theory of the intracollisional field effect in semiconductor superlattices
ROSSI, FAUSTO;
1997
Abstract
A detailed analysis of the optical and transport properties of semiconductor superlattices in the high-field regime is presented. Electronic Bloch oscillations and the resulting terahertz emission signals are computed including phonon damping in the presence of the electric field. The modifications of the phonon-induced terahertz signal decay are analyzed including the movement of the carriers in the field (intracollisional field effect). For elevated fields it is shown that the interplay between electric field and electron-phonon interaction leads to resonance structures in the terahertz damping rate.File | Dimensione | Formato | |
---|---|---|---|
Hader-Rossi_PRB_55_13799_1997.pdf
accesso aperto
Tipologia:
2. Post-print / Author's Accepted Manuscript
Licenza:
Pubblico - Tutti i diritti riservati
Dimensione
290.46 kB
Formato
Adobe PDF
|
290.46 kB | Adobe PDF | Visualizza/Apri |
Pubblicazioni consigliate
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
https://hdl.handle.net/11583/2498495
Attenzione
Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo