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EnglishWe show that contrast analysis carried out by standard optical microscopy can be employed as a simple and quick technique to monitor the cleanness of graphene during the process steps required for device fabrication. Graphene flakes deposited by adhesive tape exfoliation can display a strong contrast increase upon processing, due to the organic contamination arising from the diffusion of glue residues over the samples. On the other hand, graphene deposited by an adhesive-free method, such as electrostatic deposition, does not show any contrast variation, suggesting a low degree of contamination. Therefore, the fabrication process of graphene-based devices may be monitored and optimized on the basis of an easy optical inspection.
Assessment of graphene quality by quantitative optical contrast analysis / Bruna, Matteo; Borini, Stefano Marco. - In: JOURNAL OF PHYSICS. D, APPLIED PHYSICS. - ISSN 1361-6463. - 42:(2009). [10.1088/0022-3727/42/17/175307]
| Titolo: | Assessment of graphene quality by quantitative optical contrast analysis | |
| Autori: | ||
| Data di pubblicazione: | 2009 | |
| Rivista: | ||
| Digital Object Identifier (DOI): | http://dx.doi.org/10.1088/0022-3727/42/17/175307 | |
| Appare nelle tipologie: | 1.1 Articolo in rivista |
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