Archivio Istituzionale della RicercaAn accurate measurement method to extract the common mode (CM) and the differential mode (DM) noise source impedances of a switched mode power supply (SMPS) under its operating condition is developed and validated. With a proper pre-measurement calibration process, the proposed method allows extraction of both the CM and the DM noise source impedances with very good accuracy. These noise source impedances come in handy to design an electromagnetic interference (EMI) filter for a SMPS systematically with minimum hassle.
Accurate Extraction of Noise Source Impedance of an SMPS Under Operating Conditions / Tarateeraseth, V.; Bo, Hu; Kye Yak, See; Canavero, Flavio. - In: IEEE TRANSACTIONS ON POWER ELECTRONICS. - ISSN 0885-8993. - STAMPA. - Vol. 25:1(2010), pp. 111-117. [10.1109/TPEL.2009.2024675]
Accurate Extraction of Noise Source Impedance of an SMPS Under Operating Conditions
CANAVERO, Flavio
2010
Abstract
An accurate measurement method to extract the common mode (CM) and the differential mode (DM) noise source impedances of a switched mode power supply (SMPS) under its operating condition is developed and validated. With a proper pre-measurement calibration process, the proposed method allows extraction of both the CM and the DM noise source impedances with very good accuracy. These noise source impedances come in handy to design an electromagnetic interference (EMI) filter for a SMPS systematically with minimum hassle.
| File | Dimensione | Formato | |
|---|---|---|---|
|
p-electr-SMPS-Impedance-2010.pdf
accesso aperto
Tipologia:
2. Post-print / Author's Accepted Manuscript
Licenza:
PUBBLICO - Tutti i diritti riservati
Dimensione
1.72 MB
Formato
Adobe PDF
|
1.72 MB | Adobe PDF | Visualizza/Apri |
Pubblicazioni consigliate
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
https://hdl.handle.net/11583/2362053
Attenzione
Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo