This paper addresses the generation of accurate and efficient behavioral models of digital ICs. The proposed approach is based on the approximation of the device port characteristics by means of composite local linear state-space relations whose parameters can effectively be estimated from device port transient responses via well-established system identification techniques. The proposedmodels have been proven to overcome some inherent limitations of the state-of-the-art models used so far, and they can effectively be implemented in any commercial tool as Simulation Program with Integrated Circuit Emphasis (SPICE) subcircuits or VHDL-AMS hardware descriptions. A systematic study of the performances of the proposed state-space models is carried out on a synthetic test device. The effectiveness of the proposed approach has been demonstrated on a real application problem involving commercial devices and a data link of a mobile phone.
Behavioral Modelling of Digital Devices Via Composite Local-Linear State-Space Relations / Stievano I.S.; Siviero C.; Canavero F.G.; Maio I.A.. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - STAMPA. - 57:8(2008), pp. 1757-1765.
|Titolo:||Behavioral Modelling of Digital Devices Via Composite Local-Linear State-Space Relations|
|Data di pubblicazione:||2008|
|Digital Object Identifier (DOI):||http://dx.doi.org/10.1109/TIM.2008.925343|
|Appare nelle tipologie:||1.1 Articolo in rivista|