Thermal diffusivity of low conducting materials is measured by detecting the thermal expansion of a cylindrical specimen heated at one base, in contact with a copper disc. The simultaneous recording of the temperature of the copper and of the capacitive signal by which one can measure the dilation of the specimen allows the experimental determination of thermal diffusivity without the uncontrolled heat losses which usually occur due to temperature sensors.
Dilatometric determination of thermal diffusivity in low conducting materials / Omini, M.; Sparavigna, Amelia Carolina; Strigazzi, Alfredo. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - STAMPA. - 1:2(1990), pp. 166-171. [10.1088/0957-0233/1/2/011]
Dilatometric determination of thermal diffusivity in low conducting materials
SPARAVIGNA, Amelia Carolina;STRIGAZZI, Alfredo
1990
Abstract
Thermal diffusivity of low conducting materials is measured by detecting the thermal expansion of a cylindrical specimen heated at one base, in contact with a copper disc. The simultaneous recording of the temperature of the copper and of the capacitive signal by which one can measure the dilation of the specimen allows the experimental determination of thermal diffusivity without the uncontrolled heat losses which usually occur due to temperature sensors.Pubblicazioni consigliate
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
https://hdl.handle.net/11583/1405992
Attenzione
Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo