Extensive system testing is mandatory nowadays to achieve high product quality. Telecommunication systems are particularly sensitive to such a requirement; to maintain market competitiveness, manufacturers need to combine reduced costs, shorter life cycles, advanced technologies, and high quality. Moreover, strict reliability constraints usually impose very low fault latencies and a high degree of fault detection for both permanent and transient faults. This article analyzes major problems related to testing complex telecommunication systems, with particular emphasis on their memory modules, often so critical from the reliability point of view. In particular, advanced BIST-based solutions are analyzed, and two significant industrial case studies presented
Testing Embedded Memories in Telecommunication Systems / Barbagallo, S.; Benso, Alfredo; Chiusano, SILVIA ANNA; Lobetti Bodoni, M.; Prinetto, Paolo Ernesto. - In: IEEE COMMUNICATIONS MAGAZINE. - ISSN 0163-6804. - STAMPA. - 37 , Issue: 6:(1999), pp. 84-89. [10.1109/35.769279]
Testing Embedded Memories in Telecommunication Systems
BENSO, Alfredo;CHIUSANO, SILVIA ANNA;PRINETTO, Paolo Ernesto
1999
Abstract
Extensive system testing is mandatory nowadays to achieve high product quality. Telecommunication systems are particularly sensitive to such a requirement; to maintain market competitiveness, manufacturers need to combine reduced costs, shorter life cycles, advanced technologies, and high quality. Moreover, strict reliability constraints usually impose very low fault latencies and a high degree of fault detection for both permanent and transient faults. This article analyzes major problems related to testing complex telecommunication systems, with particular emphasis on their memory modules, often so critical from the reliability point of view. In particular, advanced BIST-based solutions are analyzed, and two significant industrial case studies presentedFile | Dimensione | Formato | |
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https://hdl.handle.net/11583/1404459
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