This paper addresses the development of accurate and efficient behavioral models of digital integrated circuit ports from measured transient responses. The proposed approach is based on the estimation of parametric models from port voltage and current waveforms. The modeling process is described and applied to the modeling of output ports. Its feasibility is demonstrated by the identification of a real device from actual measurements, and by the comparison of the predicted device response with the measured one.
|Titolo:||Behavioral Models of I/O Ports from Measured Transient Waveforms|
|Data di pubblicazione:||2002|
|Digital Object Identifier (DOI):||10.1109/TIM.2002.808019|
|Appare nelle tipologie:||1.1 Articolo in rivista|