In this contribution, we present the results on the preparation and the characterization of MgB2 thick films supported on metal/Al2O3 and metal/BN substrates via electrophoretic deposition technique (EPD) under the electric field of 120–180 V/cm. We followed two different routes: deposition of MgB2 powder, both pure and SiC doped and deposition of boron powder. EPD was followed by a high T/high p treatment in a furnace in saturated Mg atmosphere for sinterization or annealing. The structural and morphological properties of MgB2 thick films were monitored by X-ray diffraction and scanning electron microscopy: the diffraction patterns were characteristic of the hexagonal MgB2 phase and the surfaces resulted homogeneous with grain dimensions up to 1 µm. The good superconducting properties, together with the great adherence to the substrate, possibly make these films important in view of shielding and power applications.
|Titolo:||Synthesis of MgB2 thick films by electrophoresis technique: structural and superconductive characterization|
|Data di pubblicazione:||2005|
|Digital Object Identifier (DOI):||10.1002/pssc.200460808|
|Appare nelle tipologie:||1.1 Articolo in rivista|
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