This paper deals with the control by design of digital integrated circuits conducted emission. In particular, it describes a technique to correlate the conducted emission of a digital integrated circuit (IC) with the power supply currents absorbed by its building blocks. Such a correlation allows one to derive the maximum allowable limits of current spectra at chip level in order to fulfill IC-conducted emission specifications.
Investigations on the correlations between IC conducted emission and chip-level power supply current / FIORI F.; MUSOLINO F.. - In: IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. - ISSN 0018-9375. - STAMPA. - 47:1(2005), pp. 28-33. [10.1109/TEMC.2004.842203]
|Titolo:||Investigations on the correlations between IC conducted emission and chip-level power supply current|
|Data di pubblicazione:||2005|
|Digital Object Identifier (DOI):||http://dx.doi.org/10.1109/TEMC.2004.842203|
|Appare nelle tipologie:||1.1 Articolo in rivista|