Archivio Istituzionale della RicercaTRAN, NGOC THANH MAI
TRAN, NGOC THANH MAI
Dipartimento di Elettronica e Telecomunicazioni
045017
A comprehensive analysis of error sources in electronic fully-digital impedance bridges
2021 Ortolano, Massimo; Marzano, Martina; D'Elia, Vincenzo; Tran, Ngoc Thanh Mai; Rybski, Ryszard; Kaczmarek, Janusz; Koziol, Miroslaw; Musiol, Krzysztof; Christensen, Andreas Elmholdt; Callegaro, Luca; Kucera, Jan; Power, Oliver
Design and development of a coaxial cryogenic probe for precision measurements of the quantum hall effect in the ac regime
2021 Marzano, M.; Tran, N. T. M.; D'Elia, V.; Serazio, D.; Enrico, E.; Ortolano, M.; Pierz, K.; Kucera, J.; Callegaro, L.
A Capacitance Build-Up Method to Determine LCR Meter Errors and Capacitance Transfer
2020 Tran, Ngoc Thanh Mai; D'Elia, Vincenzo; Callegaro, Luca; Ortolano, Massimo
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| A comprehensive analysis of error sources in electronic fully-digital impedance bridges / Ortolano, Massimo; Marzano, Martina; D'Elia, Vincenzo; Tran, Ngoc Thanh Mai; Rybski, Ryszard; Kaczmarek, Janusz; Koziol, Miroslaw; Musiol, Krzysztof; Christensen, Andreas Elmholdt; Callegaro, Luca; Kucera, Jan; Power, Oliver. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - ELETTRONICO. - 70:(2021), pp. 1-14. [10.1109/TIM.2020.3034115] | 1-gen-2021 | Ortolano, MassimoTran, Ngoc Thanh Mai + | Ortolano-Acomprehensive.pdf |
| Design and development of a coaxial cryogenic probe for precision measurements of the quantum hall effect in the ac regime / Marzano, M.; Tran, N. T. M.; D'Elia, V.; Serazio, D.; Enrico, E.; Ortolano, M.; Pierz, K.; Kucera, J.; Callegaro, L.. - In: ACTA IMEKO. - ISSN 0237-028X. - ELETTRONICO. - 10:2(2021), pp. 24-29. [10.21014/acta_imeko.v10i2.925] | 1-gen-2021 | Tran N. T. M.Ortolano M. + | Marzano2021_ACTAIMEKO_10_24.pdf |
| A Capacitance Build-Up Method to Determine LCR Meter Errors and Capacitance Transfer / Tran, Ngoc Thanh Mai; D'Elia, Vincenzo; Callegaro, Luca; Ortolano, Massimo. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - STAMPA. - 69:8(2020), pp. 5727-5735. [10.1109/TIM.2019.2960620] | 1-gen-2020 | Tran, Ngoc Thanh MaiOrtolano, Massimo + | Tran2019_TIM_final.pdf; Ortolano-Acapacitance.pdf |