QUITADAMO, MATTEO VINCENZO
 Distribuzione geografica
Continente #
EU - Europa 147
NA - Nord America 37
AS - Asia 26
AF - Africa 4
Totale 214
Nazione #
IT - Italia 99
US - Stati Uniti d'America 36
GB - Regno Unito 23
IR - Iran 9
DE - Germania 8
CN - Cina 6
FR - Francia 6
BE - Belgio 3
DZ - Algeria 3
CZ - Repubblica Ceca 2
HK - Hong Kong 2
IN - India 2
KR - Corea 2
LT - Lituania 2
AE - Emirati Arabi Uniti 1
BG - Bulgaria 1
CA - Canada 1
ES - Italia 1
IE - Irlanda 1
JP - Giappone 1
SG - Singapore 1
TR - Turchia 1
TW - Taiwan 1
UA - Ucraina 1
ZA - Sudafrica 1
Totale 214
Città #
Torino 24
Southend 22
Milan 12
Chandler 5
Assèmini 4
Fremont 4
Turin 4
Udine 4
Aachen 3
Algiers 3
Basking Ridge 3
Chongqing 3
Duncan 3
Houston 3
Washington 3
Buffalo 2
Hamont 2
Livorno 2
Napoli 2
Poggiomarino 2
San Donato Milanese 2
Seoul 2
Backnang 1
Berlin 1
Bologna 1
Central District 1
Como 1
Dublin 1
Easton 1
Guangzhou 1
Gurgaon 1
Harbin 1
Izmir 1
Lainate 1
Leuven 1
Mede 1
Messina 1
Mountain View 1
Nuremberg 1
Palermo 1
Pamparato 1
Pars 1
Rome 1
Sabz 1
San Mateo 1
Singapore 1
Surat 1
Taipei 1
Thoiry 1
Toronto 1
Trento 1
Urbana 1
Verona 1
Wixom 1
Yambol 1
Totale 147
Nome #
Test Solution for Heatsinks in Power Electronics Applications, file e384c432-00b7-d4b2-e053-9f05fe0a1d67 99
Testing Heatsink Faults in Power Transistors by means of Thermal Model, file e384c432-04d9-d4b2-e053-9f05fe0a1d67 79
Optimal Tuning of AGDs Parameters and a Technique for Testing the Correct Mounting of Heatsinks on Power Transistors, file e384c434-8e89-d4b2-e053-9f05fe0a1d67 8
Optimal Tuning of AGDs Parameters and a Technique for Testing the Correct Mounting of Heatsinks on Power Transistors, file e384c434-8e88-d4b2-e053-9f05fe0a1d67 6
A SPICE model of Operational Amplifiers for Electromagnetic Compatibility Analysis, file e384c434-72e1-d4b2-e053-9f05fe0a1d67 5
Investigations on Operating Condition Variations in Open-Loop Active Gate Drivers, file e384c434-2a6c-d4b2-e053-9f05fe0a1d67 4
A Criterion for an Optimal Switching of Power Transistors, file e384c431-5989-d4b2-e053-9f05fe0a1d67 3
Testing Heatsink Faults in Power Transistors by means of Thermal Model, file e384c432-2497-d4b2-e053-9f05fe0a1d67 3
A New Technique to Check the Correct Mounting of the Power Module Heatsinks, file e384c434-1f41-d4b2-e053-9f05fe0a1d67 3
A New Approach to Characterize Complex ICs in Terms of Scattering Parameters, file e384c42f-dbb0-d4b2-e053-9f05fe0a1d67 2
A New Technique to Check the Correct Mounting of the Power Module Heatsinks, file e384c434-8e7a-d4b2-e053-9f05fe0a1d67 2
Faults Detection in the Heatsinks Mounted on Power Electronic Transistors, file e67fe312-4725-4da4-9799-3df967d3ce15 2
Investigation on the Switching Waveforms of GaN Power Devices to Gate Current Profiles, file e384c431-3db7-d4b2-e053-9f05fe0a1d67 1
Totale 217
Categoria #
all - tutte 637
article - articoli 183
book - libri 0
conference - conferenze 127
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 947


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/202027 0 0 0 1 0 0 0 0 0 0 6 20
2020/202164 7 2 4 2 1 4 7 9 11 6 5 6
2021/202284 11 12 4 4 9 3 6 9 12 6 6 2
2022/202327 4 1 1 7 0 1 0 5 5 3 0 0
2023/202413 0 0 0 0 0 0 3 2 1 7 0 0
Totale 217