Archivio Istituzionale della RicercaVENTURA, FRANCESCO
VENTURA, FRANCESCO
Dipartimento di Automatica e Informatica
041652
Explaining deep convolutional models by measuring the influence of interpretable features in image classification
2024 Ventura, Francesco; Greco, Salvatore; Apiletti, Daniele; Cerquitelli, Tania
Trusting deep learning natural-language models via local and global explanations
2022 Ventura, Francesco; Greco, Salvatore; Apiletti, Daniele; Cerquitelli, Tania
Enhancing manufacturing intelligence through an unsupervised data-driven methodology for cyclic industrial processes
2021 Cerquitelli, Tania; Ventura, Francesco; Apiletti, Daniele; Baralis, Elena; Macii, Enrico; Poncino, Massimo
A cloud-to-edge approach to support predictive analytics in robotics industry
2020 Panicucci, S.; Nikolakis, N.; Cerquitelli, T.; Ventura, F.; Proto, S.; Macii, E.; Makris, S.; Bowden, D.; Becker, P.; O'Mahony, N.; Morabito, L.; Napione, C.; Marguglio, A.; Coppo, G.; Andolina, S.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Explaining deep convolutional models by measuring the influence of interpretable features in image classification / Ventura, Francesco; Greco, Salvatore; Apiletti, Daniele; Cerquitelli, Tania. - In: DATA MINING AND KNOWLEDGE DISCOVERY. - ISSN 1573-756X. - 38:(2024), pp. 3169-3226. [10.1007/s10618-023-00915-x] | 1-gen-2024 | Ventura, FrancescoGreco, SalvatoreApiletti, DanieleCerquitelli, Tania | s10618-023-00915-x.pdf |
| Trusting deep learning natural-language models via local and global explanations / Ventura, Francesco; Greco, Salvatore; Apiletti, Daniele; Cerquitelli, Tania. - In: KNOWLEDGE AND INFORMATION SYSTEMS. - ISSN 0219-1377. - 64:(2022), pp. 1863-1907. [10.1007/s10115-022-01690-9] | 1-gen-2022 | Ventura,FrancescoGreco,SalvatoreApiletti,DanieleCerquitelli,Tania | Trusting deep learning natural-language models via local and global explanations.pdf; s10115-022-01690-9.pdf |
| Enhancing manufacturing intelligence through an unsupervised data-driven methodology for cyclic industrial processes / Cerquitelli, Tania; Ventura, Francesco; Apiletti, Daniele; Baralis, Elena; Macii, Enrico; Poncino, Massimo. - In: EXPERT SYSTEMS WITH APPLICATIONS. - ISSN 0957-4174. - ELETTRONICO. - 182 (115269):(2021). [10.1016/j.eswa.2021.115269] | 1-gen-2021 | Cerquitelli, TaniaVentura, FrancescoApiletti, DanieleBaralis, ElenaMacii, EnricoPoncino, Massimo | Pre-Proof-PDF.pdf; 1-s2.0-S0957417421007004-main.pdf |
| A cloud-to-edge approach to support predictive analytics in robotics industry / Panicucci, S.; Nikolakis, N.; Cerquitelli, T.; Ventura, F.; Proto, S.; Macii, E.; Makris, S.; Bowden, D.; Becker, P.; O'Mahony, N.; Morabito, L.; Napione, C.; Marguglio, A.; Coppo, G.; Andolina, S.. - In: ELECTRONICS. - ISSN 2079-9292. - STAMPA. - 9:3(2020), pp. 492-513. [10.3390/electronics9030492] | 1-gen-2020 | Cerquitelli T.Ventura F.Proto S.Macii E. + | electronics-09-00492.pdf |