Archivio Istituzionale della RicercaBAVA, ELIO
BAVA, ELIO
Dipartimento di Elettronica (attivo dal 01/01/1900 al 31/12/2011)
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Risultati 1 - 15 di 15 (tempo di esecuzione: 0.023 secondi).
Optical frequency standard by HI Doppler-broadened absorption and external-cavity laser diode at 1.541 µm
2008 Pesatori, A; Norgia, M; Calabrese, V; Galzerano, G; Bava, Elio; Svelto, C.
Amplitude and frequency noise sensitivities of optical frequency discriminators based on Fabry-Perot interferometers and the FM technique
2006 Bava, Elio; G., Galzerano; C., Svelto
FM Spectroscopy of Monodeuterated Methane as a Frequency Standard at 1.54 µm
2005 C., Svelto; M., Norgia; Bava, Elio; G., Galzerano
Measurements of Near Infrared Frequency Mixing by Metal-Semiconductor Point-Contact Diodes
2005 Bava, Elio; N., Beverini; G., Carelli; A., DE MICHELE; G., Galzerano; E., Maccioni; A., Moretti; M., Prevedelli; F., Sorrentino; C., Svelto
Frequency stabilisation of a 1.54 µm Er-Yb microlaser against Doppler-free 13C2H2 absorptions
2002 Galzerano, G.; Svelto, C.; Ferrario, F.; Bava, Elio
Frequency-Noise Sensitivity and Amplitude-Noise Immunity of Discriminators Based on Fringe-Side Fabry-Perot Cavities
2002 Bava, Elio; Galzerano, G.; Svelto, C.
High-Resolution Spectroscopy of the 39K Transitions at 770 nm and 13C2H2 Saturated Lines by a Solid-State Laser at 1.54 um: Toward an Accurate Frequency Standard in the Optical Communication Band
2002 Svelto, C.; Galzerano, G.; Bava, Elio; Ferrario, F.; Arie, A.; Klein, R.; Arbore, M. A.; Fejer, M. A.; Onae, A.; Marano, M.
Amplitude and frequency stabilized solid-state lasers in the near infrared
2001 Laporta, P.; Taccheo, S.; Marano, M.; Svelto, O.; Bava, Elio; Galzerano, G; Svelto, C.
Diode-pumped 2 μm optical oscillator for high-resolution spectroscopy and frequency metrology
2001 Galzerano, G.; Svelto, C.; Bava, Elio
Amplitude response of Fabry-Perot frequency discriminators UFFC
2000 Bava, Elio; G., Galzerano; C., Svelto
Measurement and characterization of the frequency noise of a laser-diode-pumped single-frequency Tm-Ho:YAG laser
2000 P., Laporta; Bava, Elio; C., Svelto; A., Sapia; A., Cosentino
Frequency stabilization of frequency-doubled Nd:YAG lasers at 532 nm by Frequency Modulation Spectroscopy technique
1999 Bava, Elio; Bava, E.; Bisi, M.; Bertinetto, F.; Svelto, C.
High frequency stability diode-pumped Nd: YAG lasers using the FM side-bands method and Doppler-free iodine lines at 532 nm
1999 G., Galzerano; C., Svelto; Bava, Elio; F., Bertinetto
Absolute frequency stabilization of two diode-pumped Er-Yb:glass lasers to the acetylene P(15) line at 1534 nm
1998 Svelto, C.; Bava, E.; Taccheo, S.; Laporta, P.
Frequency stabilization to a molecular line of a diode-pumped Er-Yb laser at 1533-nm wavelength
1995 Taccheo, S.; Longhi, S.; Pallaro, L.; Laporta, P.; Svelto, C.; Bava, E.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Optical frequency standard by HI Doppler-broadened absorption and external-cavity laser diode at 1.541 µm / Pesatori, A; Norgia, M; Calabrese, V; Galzerano, G; Bava, Elio; Svelto, C.. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 57(8):(2008), pp. 1708-1712. | 1-gen-2008 | BAVA, ELIO + | - |
| Amplitude and frequency noise sensitivities of optical frequency discriminators based on Fabry-Perot interferometers and the FM technique / Bava, Elio; G., Galzerano; C., Svelto. - In: REVIEW OF SCIENTIFIC INSTRUMENTS. - ISSN 0034-6748. - 77:(2006). | 1-gen-2006 | BAVA, ELIO + | - |
| FM Spectroscopy of Monodeuterated Methane as a Frequency Standard at 1.54 µm / C., Svelto; M., Norgia; Bava, Elio; G., Galzerano. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - Vol. 54, No. 4:(2005), pp. 1630-1633. | 1-gen-2005 | BAVA, ELIO + | - |
| Measurements of Near Infrared Frequency Mixing by Metal-Semiconductor Point-Contact Diodes / Bava, Elio; N., Beverini; G., Carelli; A., DE MICHELE; G., Galzerano; E., Maccioni; A., Moretti; M., Prevedelli; F., Sorrentino; C., Svelto. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - Vol. 54, No. 4,:(2005), pp. 1407-1411. | 1-gen-2005 | BAVA, ELIO + | - |
| Frequency stabilisation of a 1.54 µm Er-Yb microlaser against Doppler-free 13C2H2 absorptions / Galzerano, G.; Svelto, C.; Ferrario, F.; Bava, Elio. - In: OPTICS COMMUNICATIONS. - ISSN 0030-4018. - 209(4-6):(2002), pp. 411-416. | 1-gen-2002 | BAVA, ELIO + | - |
| Frequency-Noise Sensitivity and Amplitude-Noise Immunity of Discriminators Based on Fringe-Side Fabry-Perot Cavities / Bava, Elio; Galzerano, G.; Svelto, C.. - In: IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL. - ISSN 0885-3010. - 49(8):(2002), pp. 1150-1159. | 1-gen-2002 | BAVA, ELIO + | - |
| High-Resolution Spectroscopy of the 39K Transitions at 770 nm and 13C2H2 Saturated Lines by a Solid-State Laser at 1.54 um: Toward an Accurate Frequency Standard in the Optical Communication Band / Svelto, C.; Galzerano, G.; Bava, Elio; Ferrario, F.; Arie, A.; Klein, R.; Arbore, M. A.; Fejer, M. A.; Onae, A.; Marano, M.. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 51(4):(2002). | 1-gen-2002 | BAVA, ELIO + | - |
| Amplitude and frequency stabilized solid-state lasers in the near infrared / Laporta, P.; Taccheo, S.; Marano, M.; Svelto, O.; Bava, Elio; Galzerano, G; Svelto, C.. - In: JOURNAL OF PHYSICS D. APPLIED PHYSICS. - ISSN 0022-3727. - 34:16(2001), pp. 2396-2407. [10.1088/0022-3727/34/16/303] | 1-gen-2001 | TACCHEO S.BAVA, ELIO + | - |
| Diode-pumped 2 μm optical oscillator for high-resolution spectroscopy and frequency metrology / Galzerano, G.; Svelto, C.; Bava, Elio. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 50:(2001), pp. 1003-1006. | 1-gen-2001 | BAVA, ELIO + | - |
| Amplitude response of Fabry-Perot frequency discriminators UFFC / Bava, Elio; G., Galzerano; C., Svelto. - In: IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL. - ISSN 0885-3010. - 47:(2000), pp. 1115-1121. | 1-gen-2000 | BAVA, ELIO + | - |
| Measurement and characterization of the frequency noise of a laser-diode-pumped single-frequency Tm-Ho:YAG laser / P., Laporta; Bava, Elio; C., Svelto; A., Sapia; A., Cosentino. - In: OPTICAL AND QUANTUM ELECTRONICS. - ISSN 0306-8919. - 32:(2000), pp. 1081-1095. | 1-gen-2000 | BAVA, ELIO + | - |
| Frequency stabilization of frequency-doubled Nd:YAG lasers at 532 nm by Frequency Modulation Spectroscopy technique / Bava, Elio; Bava, E.; Bisi, M.; Bertinetto, F.; Svelto, C.. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 48(2):(1999), pp. 540-543. | 1-gen-1999 | BAVA, ELIO + | - |
| High frequency stability diode-pumped Nd: YAG lasers using the FM side-bands method and Doppler-free iodine lines at 532 nm / G., Galzerano; C., Svelto; Bava, Elio; F., Bertinetto. - In: APPLIED OPTICS. - ISSN 0003-6935. - 38:33(1999), pp. 6962-6966. [10.1364/AO.38.006962] | 1-gen-1999 | BAVA, ELIO + | - |
| Absolute frequency stabilization of two diode-pumped Er-Yb:glass lasers to the acetylene P(15) line at 1534 nm / Svelto, C.; Bava, E.; Taccheo, S.; Laporta, P.. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - STAMPA. - 73:13(1998), pp. 1778-1780. [10.1063/1.122279] | 1-gen-1998 | Bava E.Taccheo S. + | Taccheo-Absolute.pdf |
| Frequency stabilization to a molecular line of a diode-pumped Er-Yb laser at 1533-nm wavelength / Taccheo, S.; Longhi, S.; Pallaro, L.; Laporta, P.; Svelto, C.; Bava, E.. - In: OPTICS LETTERS. - ISSN 0146-9592. - STAMPA. - 20:23(1995), pp. 2420-2422. [10.1364/OL.20.002420] | 1-gen-1995 | Taccheo S.Bava E. + | Taccheo-Frequency.pdf |