Archivio Istituzionale della RicercaZAMAN, MUHAMMAD YOUSUF
ZAMAN, MUHAMMAD YOUSUF
Dipartimento di Fisica (attivo dal 01/01/1900 al 31/12/2011)
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Barrier inhomogeneities of a medium size Mo/4H-SiC Schottky diode
2012-01-01 Zaman, MUHAMMAD YOUSUF; Perrone, Denis; Ferrero, Sergio; Scaltrito, Luciano; Naretto, Marco
Evaluation of correct value of Richardson's constant by analyzing the electrical behavior of three different diodes at different temperatures
2012-01-01 Zaman, MUHAMMAD YOUSUF; Perrone, Denis; Ferrero, Sergio; Scaltrito, Luciano; Naretto, Marco
Fabrication of Ni/Ti/Al Schottky contact to n-type 4H-SiC under various annealing conditions
2013-01-01 Zaman, MUHAMMAD YOUSUF; Ferrero, Sergio; Perrone, Denis; Scaltrito, Luciano; Shahzad, Nadia; Pugliese, Diego
Modeling and Characterization of Metal/SiC Interface for Power Device Application
2013-01-01 Zaman, MUHAMMAD YOUSUF
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Barrier inhomogeneities of a medium size Mo/4H-SiC Schottky diode / Zaman M. Y.; Perrone D.; Ferrero S.; Scaltrito L.; Naretto M.. - 711:(2012), pp. 188-192. [10.4028/www.scientific.net/MSF.711.188] | 1-gen-2012 | ZAMAN, MUHAMMAD YOUSUFPERRONE, DENISFERRERO, SERGIOSCALTRITO, LUCIANONARETTO, MARCO | - |
| Evaluation of correct value of Richardson's constant by analyzing the electrical behavior of three different diodes at different temperatures / Zaman M. Y.; Perrone D.; Ferrero S.; Scaltrito L.; Naretto M.. - 711:(2012), pp. 174-178. [10.4028/www.scientific.net/MSF.711.174] | 1-gen-2012 | ZAMAN, MUHAMMAD YOUSUFPERRONE, DENISFERRERO, SERGIOSCALTRITO, LUCIANONARETTO, MARCO | - |
| Fabrication of Ni/Ti/Al Schottky contact to n-type 4H-SiC under various annealing conditions / Zaman, MUHAMMAD YOUSUF; Ferrero, Sergio; Perrone, Denis; Scaltrito, Luciano; Shahzad, Nadia; Pugliese, Diego. - In: JOURNAL OF PHYSICS. CONFERENCE SERIES. - ISSN 1742-6588. - 439:(2013). [10.1088/1742-6596/439/1/012027] | 1-gen-2013 | ZAMAN, MUHAMMAD YOUSUFFERRERO, SERGIOPERRONE, DENISSCALTRITO, LUCIANOSHAHZAD, NADIAPUGLIESE, DIEGO | - |
| Modeling and Characterization of Metal/SiC Interface for Power Device Application / Zaman, MUHAMMAD YOUSUF. - STAMPA. - (2013). [10.6092/polito/porto/2506104] | 1-gen-2013 | ZAMAN, MUHAMMAD YOUSUF | Muhammad Yousuf Zaman.pdf |