WO/2025/154007 TESTING SYSTEM AND TEST METHOD

A test system (200) is described for applying test stimuli and test measurements to at least one device to be tested (DUT), comprising: - electronic control means (202) and a plurality of test modules (204); - a first communication network (206) arranged to enable communication between the electronic control means (202) and the plurality of test modules (204) at a first communication speed; - a second communication network (208) arranged to enable communication between the plurality of test modules (204) at a second communication speed with latency lower than a maximum latency; the value of the maximum latency is a function of a discretization time of the test stimuli and test measurements to be applied by the test system.