A system (100) for determining commands to be executed by a test machine (112) for applying test stimuli and measurements onto at least one device to be tested (DUT) is described. The system (100) includes electronic control means (102) configured to receive input information (104) relating to a structure of the at least one device to be tested (DUT), information (106) relating to the test stimuli and test measurements to be applied onto the at least one device to be tested (DUT), and information (108) relating to the test machine (112) by means of which the test stimuli and test measurements are to be applied onto the at least one device to be tested (DUT). The electronic control means (102) are also configured to determine the commands (110) configured to be provided to the test machine (112) and to be executed by the test machine (112) to apply the test stimuli and test measurements onto the at least one device to be tested (DUT), based on at least the information relating to the structure of the at least one device to be tested (DUT), the information relating to the test stimuli and test measurements to be applied onto the at least one device to be tested (DUT), and the information relating to the test machine (112) by means of which the test stimuli and test measurements are to be applied onto the at least one device to be tested (DUT), received as input. A corresponding process and a test system (500) are also described.

WO2025099583 - SYSTEM FOR DETERMINING COMMANDS TO BE EXECUTED BY A TEST MACHINE FOR APPLYING TEST STIMULI AND MEASUREMENTS ONTO AT LEAST ONE DEVICE TO BE TESTED, CORRESPONDING METHOD, AND TEST SYSTEM / Cianferotti, Carlo; Marcinno', Marco; Rava, Alberto; Ruo Roch, Massimo. - (2024).

WO2025099583 - SYSTEM FOR DETERMINING COMMANDS TO BE EXECUTED BY A TEST MACHINE FOR APPLYING TEST STIMULI AND MEASUREMENTS ONTO AT LEAST ONE DEVICE TO BE TESTED, CORRESPONDING METHOD, AND TEST SYSTEM

RUO ROCH Massimo
2024

Abstract

A system (100) for determining commands to be executed by a test machine (112) for applying test stimuli and measurements onto at least one device to be tested (DUT) is described. The system (100) includes electronic control means (102) configured to receive input information (104) relating to a structure of the at least one device to be tested (DUT), information (106) relating to the test stimuli and test measurements to be applied onto the at least one device to be tested (DUT), and information (108) relating to the test machine (112) by means of which the test stimuli and test measurements are to be applied onto the at least one device to be tested (DUT). The electronic control means (102) are also configured to determine the commands (110) configured to be provided to the test machine (112) and to be executed by the test machine (112) to apply the test stimuli and test measurements onto the at least one device to be tested (DUT), based on at least the information relating to the structure of the at least one device to be tested (DUT), the information relating to the test stimuli and test measurements to be applied onto the at least one device to be tested (DUT), and the information relating to the test machine (112) by means of which the test stimuli and test measurements are to be applied onto the at least one device to be tested (DUT), received as input. A corresponding process and a test system (500) are also described.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/3005015
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