This paper presents the campaign for the characterization of a GaN packaged power transistor, with the aim to test the foundry model accuracy in a non-conventional mode of operation. In particular, the device is adopted for the design of a 30 W, 435 MHz class E power amplifier to be inserted in a radio-frequency pulse-width-modulator for space application. Due to the biasing class of operation (class C), the conditions normally used for modelling are very different to the current design in terms of driving waveform (non-sinusoidal) and high order harmonics' terminations (in open circuit). In this framework, this campaign allowed for verification of the model accuracy, hence increasing the probability of success of the final design. The adopted measurement set-up and the characterization results are discussed in details.

Characterization of a high power GaN device for class E PA design with non-sinusoidal stimulus / Camarchia, V; Cipriani, Fabio Eugenio Giovanni; Colantonio, P; Pirola, M; Quaglia, R; Cabria, L; Ayllon, N - In: Proceedings of the 11th European Microwave Integrated Circuits Conference / Camarchia, V. - 345 E 47TH ST, NEW YORK, NY 10017 USA : IEEE, 2016. - pp. 53-56 [10.1109/EuMIC.2016.7777487]

Characterization of a high power GaN device for class E PA design with non-sinusoidal stimulus

Camarchia, V;CIPRIANI, Fabio Eugenio Giovanni;Colantonio, P;Pirola, M;Quaglia, R;
2016

Abstract

This paper presents the campaign for the characterization of a GaN packaged power transistor, with the aim to test the foundry model accuracy in a non-conventional mode of operation. In particular, the device is adopted for the design of a 30 W, 435 MHz class E power amplifier to be inserted in a radio-frequency pulse-width-modulator for space application. Due to the biasing class of operation (class C), the conditions normally used for modelling are very different to the current design in terms of driving waveform (non-sinusoidal) and high order harmonics' terminations (in open circuit). In this framework, this campaign allowed for verification of the model accuracy, hence increasing the probability of success of the final design. The adopted measurement set-up and the characterization results are discussed in details.
Proceedings of the 11th European Microwave Integrated Circuits Conference
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2709889
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