Archivio Istituzionale della RicercaIQBAL, MUSTAZAR
IQBAL, MUSTAZAR
Dipartimento di Elettronica e Telecomunicazioni
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A comprehensive comparison between GaN MMIC Doherty and combined class-AB power amplifiers for microwave radio links
2016 Giofrè, Rocco; Colantonio, Paolo; Giannini, Franco; Ramella, Chiara; Camarchia, Vittorio; Iqbal, Mustazar; Pirola, Marco; Quaglia, Roberto
Hot-electron reliability improvement using perhydropolysilazane spin-on-dielectric passivation buffer layers for AlGaN/GaN HEMTs
2014 Iqbal, Mustazar; Ko, Pil Seok; Kim, Sam Dong
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| A comprehensive comparison between GaN MMIC Doherty and combined class-AB power amplifiers for microwave radio links / Giofrè, R., Colantonio, P., Giannini, F., Ramella, C., Camarchia, V., Iqbal, M., Pirola, M., Quaglia, R.. - In: INTERNATIONAL JOURNAL OF MICROWAVE AND WIRELESS TECHNOLOGIES. - ISSN 1759-0787. - STAMPA. - 8:4-5(2016), pp. 673-681. [10.1017/S175907871600012X] | 1-gen-2016 | RAMELLA, CHIARACAMARCHIA, VITTORIOIQBAL, MUSTAZARPIROLA, MarcoQUAGLIA, ROBERTO + | - |
| Hot-electron reliability improvement using perhydropolysilazane spin-on-dielectric passivation buffer layers for AlGaN/GaN HEMTs / Iqbal, M., Ko, P.S., Kim, S.D.. - In: CURRENT APPLIED PHYSICS. - ISSN 1567-1739. - 14:8(2014), pp. 1099-1104. [10.1016/j.cap.2014.05.014] | 1-gen-2014 | IQBAL, MUSTAZAR + | - |