PAGLIARINO, VALERIO

PAGLIARINO, VALERIO  

Dipartimento di Elettronica e Telecomunicazioni  

112553  

Mostra records
Risultati 1 - 4 di 4 (tempo di esecuzione: 0.009 secondi).
Citazione Data di pubblicazione Autori File
Integrated electronics for the readout of neutrino detectors: The case of DENEB for DUNE / Pagliarino, V.. - In: EPJ WEB OF CONFERENCES. - ISSN 2100-014X. - 388:(2026). (Nuclear Energy and its Challenging New Technologies ) [10.1051/epjconf/202638800009]. 1-gen-2026 Pagliarino, V. -
Preliminary results on the timing response of CMOS LGADs for the ALICE 3 experiment / Fabbri, G., Bregant, M., Bufalino, S., Buthelezi, Z., Carnesecchi, F., Cavazza, D., Colocci, M., Corradino, T., Da Rocha Rolo, M., Durando, S., Endrizzi, J., Ferrero, C., Foertsch, S., Follo, U., Gioachin, G., Goodhead, J., Grenno, M., Iizuka, H., Lim, B., Di Nicolantonio, G., et al.. - In: JOURNAL OF INSTRUMENTATION. - ISSN 1748-0221. - 21:(2026). (21st Trento Workshop on Advanced Silicon Radiation Detectors (TREDI 2026) Perugia (Italy) 17–19 February 2026) [10.1088/1748-0221/21/08/c08022]. 1-gen-2026 Bufalino, S.Durando, S.Follo, U.Gioachin, G.Mandurrino, M.Pagliarino, V.Pancheri, L. + Fabbri_2026_J._Inst._21_C08022.pdf
A Cryogenic 1024-Channel Mixed-Signal ASIC for SiPM Readout in 110 nm CMOS for the GRAIN Detector at DUNE / Durando, S., Blua, S., Pagliarino, V.. - (2025), pp. 1-1. (2025 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD) Yokohama (Jap) 01-08 November 2025) [10.1109/nss/mic/rtsd57106.2025.11287442]. 1-gen-2025 Durando, S.Blua, S.Pagliarino, V. A_Cryogenic_1024-Channel_Mixed-Signal_ASIC_for_SiPM_Readout_in_110_nm_CMOS_for_the_GRAIN_Detector_at_DUNE.pdf
A Scalable Data Acquisition System for Tomographic X-Ray Imaging with Monolithic CMOS Sensors / Pagliarino, V., Bortone, A., Falchieri, D., Petrini, E., Rivetti, A., Da Rocha Rolo, M.D., Zugravel, S.C.. - (2025), pp. 1-1. (2025 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD) Yokohama (Jap) 01-08 November 2025) [10.1109/nss/mic/rtsd57106.2025.11287605]. 1-gen-2025 Pagliarino, V.Zugravel, S. C. + A_Scalable_Data_Acquisition_System_for_Tomographic_X-Ray_Imaging_with_Monolithic_CMOS_Sensors.pdf