In previous papers we have addressed the problem of testing Random Number Generators (RNGs) through statistical tests, with particular emphasis on the approach we called second-level testing. We have shown that this approach is capable of achieving much higher accuracy in exposing non-random generators, but may suffer from reliability issues due to approximations introduced in the test. Here we consider the NIST Frequency Test and present a mathematical expression of the error introduced by approximating the effective discrete distribution function with its continuous limit distribution. The matching against experimental data is almost perfect. © 2008 IEEE.

On the Approximation Errors in the Frequency Test Included in the NIST SP800-22 Statistical Test Suite / Pareschi, F.; Rovatti, R.; Setti, G.. - STAMPA. - (2008), pp. 1216-1219. (Intervento presentato al convegno APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems tenutosi a Macao, chn nel November 30 - December 3, 2008) [10.1109/APCCAS.2008.4746245].

On the Approximation Errors in the Frequency Test Included in the NIST SP800-22 Statistical Test Suite

Pareschi F.;Setti G.
2008

Abstract

In previous papers we have addressed the problem of testing Random Number Generators (RNGs) through statistical tests, with particular emphasis on the approach we called second-level testing. We have shown that this approach is capable of achieving much higher accuracy in exposing non-random generators, but may suffer from reliability issues due to approximations introduced in the test. Here we consider the NIST Frequency Test and present a mathematical expression of the error introduced by approximating the effective discrete distribution function with its continuous limit distribution. The matching against experimental data is almost perfect. © 2008 IEEE.
2008
978-1-4244-2341-5
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2850197