The use of second-level testing to reduce Type II errors in RNG validation was suggested from the very beginning though rarely employed in real-world cases. Yet, as security requirements become more critical and the availability of even faster RNG more commonplace, second-level testing will be key to distinguishing RNGs based on the quality of very large chunks of their output. This paper addresses some principles governing the proper design of second-level tests (i.e. how to divide available data into chunks and how to compute second-level p-values) as well as its implications on the design of the underlying basic tests. © 2007 IEEE.

Second-level testing revisited and applications to NIST SP800-22 / Pareschi, F.; Rovatti, R.; Setti, G.. - STAMPA. - (2007), pp. 627-630. (Intervento presentato al convegno European Conference on Circuit Theory and Design 2007, ECCTD 2007 tenutosi a Seville, esp nel August 26-30, 2007) [10.1109/ECCTD.2007.4529674].

Second-level testing revisited and applications to NIST SP800-22

Pareschi F.;Setti G.
2007

Abstract

The use of second-level testing to reduce Type II errors in RNG validation was suggested from the very beginning though rarely employed in real-world cases. Yet, as security requirements become more critical and the availability of even faster RNG more commonplace, second-level testing will be key to distinguishing RNGs based on the quality of very large chunks of their output. This paper addresses some principles governing the proper design of second-level tests (i.e. how to divide available data into chunks and how to compute second-level p-values) as well as its implications on the design of the underlying basic tests. © 2007 IEEE.
2007
978-1-4244-1341-6
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2850185