We study numerically and experimentally the role of the injection current and reverse bias voltage on the pulse stability of tapered, passively mode-locked, Quantum Dot (QD) lasers. By using a multi-section delayed differential equation and introducing in the model the QD inhomogenous broadening, we are able to predict the onset of leading and trailing edge instabilities in the emitted pulse trains and to identify specific trends of stability in dependence on the laser biasing conditions. The numerical results are confirmed experimentally trough amplitude and timing stability analysis of the pulses.

Stability of the mode-locking regime in tapered quantum-dot lasers / Bardella, P.; Drzewietzki, L.; Rossetti, M.; Weber, C.; Breuer, S.. - ELETTRONICO. - 10553:(2018), p. 55. (Intervento presentato al convegno Novel In-Plane Semiconductor Lasers XVII 2018 tenutosi a San Francisco (USA) nel 29 January-1 February 2018) [10.1117/12.2290749].

Stability of the mode-locking regime in tapered quantum-dot lasers

Bardella, P.;Rossetti, M.;
2018

Abstract

We study numerically and experimentally the role of the injection current and reverse bias voltage on the pulse stability of tapered, passively mode-locked, Quantum Dot (QD) lasers. By using a multi-section delayed differential equation and introducing in the model the QD inhomogenous broadening, we are able to predict the onset of leading and trailing edge instabilities in the emitted pulse trains and to identify specific trends of stability in dependence on the laser biasing conditions. The numerical results are confirmed experimentally trough amplitude and timing stability analysis of the pulses.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2707149
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