This paper first presents an evaluation of the effectiveness of different test pattern sets in terms of ability to detect possible intra-cell defects affecting the scan flip-flops. The analysis is then used to develop an effective test solution to improve the overall test quality. As a major result, the paper demonstrates that by combining test vectors generated by a commercial ATPG to detect stuck-at and delay faults, plus a fragment of extra test patterns generated to specifically target the escaped defects, we can obtain a higher intra-cell defect coverage (i.e., 6.46% on average) and a shorter test time (i.e., 42.20% on average) than by straightforwardly using an ATPG which directly targets these defects.

Scan-Chain Intra-Cell Aware Testing / Touati, Aymen; Bosio, Alberto; Girard, Patrick; Virazel, Arnaud; Bernardi, Paolo; SONZA REORDA, Matteo; Auvray, Etienne. - In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING. - ISSN 2168-6750. - STAMPA. - (2018), pp. 1-1. [10.1109/TETC.2016.2624311]

Scan-Chain Intra-Cell Aware Testing

BERNARDI, PAOLO;SONZA REORDA, Matteo;
2018

Abstract

This paper first presents an evaluation of the effectiveness of different test pattern sets in terms of ability to detect possible intra-cell defects affecting the scan flip-flops. The analysis is then used to develop an effective test solution to improve the overall test quality. As a major result, the paper demonstrates that by combining test vectors generated by a commercial ATPG to detect stuck-at and delay faults, plus a fragment of extra test patterns generated to specifically target the escaped defects, we can obtain a higher intra-cell defect coverage (i.e., 6.46% on average) and a shorter test time (i.e., 42.20% on average) than by straightforwardly using an ATPG which directly targets these defects.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2656073
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