Self-Test strategies for testing embedded processors are increasingly diffused. In this paper, we describe a set of self-test techniques tackling dual issue embedded processors. The paper details how to produce test programs suitable to detect stuck-at faults in computational modules belonging to dual issue processors. The proposed technique is aimed at extending single issue test programs; results are illustrated for a 32-bit processor included in an automotive System-on-Chip manufactured by STMicroelectronics and implementing a dual issue strategy with static dispatch of instructions.

Software-based self-test techniques of computational modules in dual issue embedded processors / Bernardi, Paolo; Bovi, C.; Cantoro, Riccardo; De Luca, S.; Meregalli, R.; Piumatti, Davide; SANCHEZ SANCHEZ, Edgar Ernesto; Sansonetti, A.. - STAMPA. - (2015), pp. 1-2. (Intervento presentato al convegno 2015 20th IEEE European Test Symposium (ETS) tenutosi a Cluj-Napoca nel 25-29 May 2015) [10.1109/ETS.2015.7138730].

Software-based self-test techniques of computational modules in dual issue embedded processors

BERNARDI, PAOLO;CANTORO, RICCARDO;PIUMATTI, DAVIDE;SANCHEZ SANCHEZ, Edgar Ernesto;
2015

Abstract

Self-Test strategies for testing embedded processors are increasingly diffused. In this paper, we describe a set of self-test techniques tackling dual issue embedded processors. The paper details how to produce test programs suitable to detect stuck-at faults in computational modules belonging to dual issue processors. The proposed technique is aimed at extending single issue test programs; results are illustrated for a 32-bit processor included in an automotive System-on-Chip manufactured by STMicroelectronics and implementing a dual issue strategy with static dispatch of instructions.
2015
978-1-4799-7603-4
978-1-4799-7603-4
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2616967
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