Archivio Istituzionale della RicercaThe thermal diffusivity of a thin film of a substrate is measured by using the mirage technique. The photothermal deflection of the probe beam is caused by the heat field and the substrate, heated by the pump beam. From the experimental data a two-demensional algorithm is proposed to obtain the measurements of the diffusivity of film and substrate in one set of mirage deflection.
An analytical model for thermal diffusivity measurements of film substrate composite using the mirage technique / Lucia, Umberto. - In: ARI. - ISSN 1434-5641. - STAMPA. - 52:1(2001), pp. 30-32.
An analytical model for thermal diffusivity measurements of film substrate composite using the mirage technique
LUCIA, UMBERTO
2001
Abstract
The thermal diffusivity of a thin film of a substrate is measured by using the mirage technique. The photothermal deflection of the probe beam is caused by the heat field and the substrate, heated by the pump beam. From the experimental data a two-demensional algorithm is proposed to obtain the measurements of the diffusivity of film and substrate in one set of mirage deflection.
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https://hdl.handle.net/11583/2496149
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