We present a theoretical study of the crossover from the two-dimensional (2D, separate confinement of the carriers) to the three-dimensional (3D, center-of-mass confinement) behavior of excitons in shallow or narrow quantum wells (QW’s). Exciton binding energies and oscillator strengths are calculated by diagonalizing the Hamiltonian on a large nonorthogonal basis set. We prove that the oscillator strength per unit area has a minimum at the crossover, in analogy with the similar phenomenon occurring for the QW to thin-film crossover on increasing the well thickness, and in agreement with the analytic results of a simplified δ-potential model. Numerical results are obtained for GaAs/Alx Ga1-xAs and InxGa1-xAs/GaAs systems. Our approach can also be applied to obtain an accurate description of excitons in QW’s with arbitrary values of the offsets (positive or negative) and also for very narrow wells. In particular, the crossover from 2D to 3D behavior in narrow GaAs/AlxGa1-xAs QW’s is investigated: the maximum binding energy of the direct exciton in GaAs/AlAs QW’s is found to be ∼26 meV and to occur between one and two monolayers.

Crossover from strong to weak confinement for excitons in shallow or narrow quantum wells / Iotti, Rita Claudia; Andreani, L. C.. - In: PHYSICAL REVIEW. B, CONDENSED MATTER. - ISSN 0163-1829. - STAMPA. - 56:7(1997), pp. 3922-3932. [10.1103/PhysRevB.56.3922]

Crossover from strong to weak confinement for excitons in shallow or narrow quantum wells

IOTTI, Rita Claudia;
1997

Abstract

We present a theoretical study of the crossover from the two-dimensional (2D, separate confinement of the carriers) to the three-dimensional (3D, center-of-mass confinement) behavior of excitons in shallow or narrow quantum wells (QW’s). Exciton binding energies and oscillator strengths are calculated by diagonalizing the Hamiltonian on a large nonorthogonal basis set. We prove that the oscillator strength per unit area has a minimum at the crossover, in analogy with the similar phenomenon occurring for the QW to thin-film crossover on increasing the well thickness, and in agreement with the analytic results of a simplified δ-potential model. Numerical results are obtained for GaAs/Alx Ga1-xAs and InxGa1-xAs/GaAs systems. Our approach can also be applied to obtain an accurate description of excitons in QW’s with arbitrary values of the offsets (positive or negative) and also for very narrow wells. In particular, the crossover from 2D to 3D behavior in narrow GaAs/AlxGa1-xAs QW’s is investigated: the maximum binding energy of the direct exciton in GaAs/AlAs QW’s is found to be ∼26 meV and to occur between one and two monolayers.
File in questo prodotto:
File Dimensione Formato  
Iotti_PRB_56_3922_1997.pdf

accesso aperto

Tipologia: 2. Post-print / Author's Accepted Manuscript
Licenza: PUBBLICO - Tutti i diritti riservati
Dimensione 223.94 kB
Formato Adobe PDF
223.94 kB Adobe PDF Visualizza/Apri
Pubblicazioni consigliate

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/1659024
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo