Photopotential measurements were used to determine the semiconducting properties of the oxide layers formed on Fe-Cr alloys and AISI 304 stainless steel. The oxide films were obtained by two different procedures: thermal oxidation in air, and anodic oxidation. On the basis of the results obtained, it is concluded that the photoeffects are due to two independent processes: (1) the photovoltaic one, which occurs within the surface oxide film, and (2) the photogalvanic, which is produced by the photodecomposition of the oxide itself.
Caratteristiche semiconduttrici di strati passivanti formati su leghe Fe-Cr e sull'acciaio AISI 304 / Angelini, EMMA PAOLA MARIA VIRGINIA; M., Maja. - In: LA METALLURGIA ITALIANA. - ISSN 0026-0843. - STAMPA. - 69:10(1977), pp. 397-402.
Caratteristiche semiconduttrici di strati passivanti formati su leghe Fe-Cr e sull'acciaio AISI 304
ANGELINI, EMMA PAOLA MARIA VIRGINIA;
1977
Abstract
Photopotential measurements were used to determine the semiconducting properties of the oxide layers formed on Fe-Cr alloys and AISI 304 stainless steel. The oxide films were obtained by two different procedures: thermal oxidation in air, and anodic oxidation. On the basis of the results obtained, it is concluded that the photoeffects are due to two independent processes: (1) the photovoltaic one, which occurs within the surface oxide film, and (2) the photogalvanic, which is produced by the photodecomposition of the oxide itself.Pubblicazioni consigliate
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https://hdl.handle.net/11583/1653886
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