The authors prescnt a new analytical model that describes the nonlinear behaviour of common CMOS operational amplifiers excited by radio-frequency interference (RFI) added to the input nominal signals. The new model is a valid support to analogue integrated circuit designers since it expresses a relationship between circuit parameters, parasitic elements and the amplitude of the RFI induced output offset voltage of a feedback CMOS operational amplifier. The validity'of model prediction has been verified through a comparison with experimental and computer simulation results.

Prediction of EMI effects in operational amplifiers by a two input Volterra series model / Fiori, Franco; Crovetti, Paolo Stefano. - In: IEE PROCEEDINGS. CIRCUITS, DEVICES AND SYSTEMS. - ISSN 1350-2409. - STAMPA. - 150:3(2003), pp. 185-193. [10.1049/ip-cds:20030342]

Prediction of EMI effects in operational amplifiers by a two input Volterra series model

FIORI, Franco;CROVETTI, Paolo Stefano
2003

Abstract

The authors prescnt a new analytical model that describes the nonlinear behaviour of common CMOS operational amplifiers excited by radio-frequency interference (RFI) added to the input nominal signals. The new model is a valid support to analogue integrated circuit designers since it expresses a relationship between circuit parameters, parasitic elements and the amplitude of the RFI induced output offset voltage of a feedback CMOS operational amplifier. The validity'of model prediction has been verified through a comparison with experimental and computer simulation results.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/1400074
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