PORTO @ Archivio Istituzionale della Ricerca

DE SIO, CORRADO

DE SIO, CORRADO  

Dipartimento di Automatica e Informatica  

049588  

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Risultati 1 - 13 di 13 (tempo di esecuzione: 0.029 secondi).
Citazione Data di pubblicazione Autori File
CNN-Oriented Placement Algorithm for High-Performance Accelerators on Rad-Hard FPGAs / Sterpone, L.; Azimi, S.; De Sio, C. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - (2023), pp. 1-13. [10.1109/TCAD.2023.3331976] 1-gen-2023 Sterpone, L.Azimi, S.De Sio, C TCAD_2023.pdf
Evaluating Reliability against SEE of Embedded Systems: A Comparison of RTOS and Bare-metal Approaches / DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 150:(2023). [10.1016/j.microrel.2023.115124] 1-gen-2023 Corrado De SioSarah AzimiLuca Sterpone MicRel_V2.2_CD.pdf; 1-s2.0-S002627142300224X-main.pdf
Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems / Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David. - In: ELECTRONICS. - ISSN 2079-9292. - 12:1(2023), p. 169. [10.3390/electronics12010169] 1-gen-2023 Sarah AzimiCorrado De SioAndrea PortaluriDaniele RizzieriEleonora VaccaLuca Sterpone + electronics-12-00169.pdf
Fighting for a Future Free from Violence: A Framework for Real-time Detection of “Signal for Help” / Azimi, Sarah; De Sio, Corrado; Carlucci, Francesco; Sterpone, Luca. - In: INTELLIGENT SYSTEMS WITH APPLICATIONS. - ISSN 2667-3053. - 17:(2023), pp. 1-24. [10.1016/j.iswa.2022.200174] 1-gen-2023 Azimi, SarahDe Sio, CorradoCarlucci, FrancescoSterpone, Luca ISwA_2023.pdf
A Comparative Radiation Analysis of Reconfigurable Memory Technologies: FinFET versus Bulk CMOS / Azimi, S.; De Sio, C.; Portaluri, A.; Rizzieri, D.; Sterpone, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 138:(2022), pp. 1-5. [10.1016/j.microrel.2022.114733] 1-gen-2022 S. AzimiC. De SioA. PortaluriD. RizzieriL. Sterpone MicRel_CMOSvsFinFET_V3_fin.pdf; 1-s2.0-S0026271422002578-main.pdf
FireNN: Neural Networks Reliability Evaluation on Hybrid Platforms / De Sio, C.; Azimi, S.; Sterpone, L.. - In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING. - ISSN 2168-6750. - ELETTRONICO. - 10:2(2022), pp. 549-563. [10.1109/TETC.2022.3152668] 1-gen-2022 De Sio C.Azimi S.Sterpone L. FireNN_cd_2.2.pdf; FireNN_Neural_Networks_Reliability_Evaluation_on_Hybrid_Platforms.pdf
A Radiation-Hardened CMOS Full-Adder Based on Layout Selective Transistor Duplication / Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - In: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. - ISSN 1063-8210. - ELETTRONICO. - 29:8(2021), pp. 1596-1600. [10.1109/TVLSI.2021.3086897] 1-gen-2021 Azimi, SarahDe Sio, CorradoSterpone, Luca ToVLSI-Final Version.pdf; A_Radiation-Hardened_CMOS_Full-Adder_Based_on_Layout_Selective_Transistor_Duplication.pdf
Analysis of Radiation-induced Transient Errors on 7nm FinFET Technology / Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 126:(2021). [10.1016/j.microrel.2021.114319] 1-gen-2021 Azimi, SarahDe Sio, CorradoSterpone, Luca MicRel 2021.pdf; 1-s2.0-S0026271421002857-main.pdf
Analysis of Single Event Effects on Embedded Processor / Azimi, Sarah; De Sio, Corrado; Rizzieri, Daniele; Sterpone, Luca. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 10:24(2021), p. 3160. [10.3390/electronics10243160] 1-gen-2021 Azimi, SarahDe Sio, CorradoRizzieri, DanieleSterpone, Luca electronics-10-03160 (1).pdf
Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis / Yang, Wei-Tao; Du, Xue-Cheng; Li, Yong-Hong; He, Chao-Hui; Guo, Gang; Shi, Shu-Ting; Cai, Li; Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - In: NUCLEAR SCIENCE AND TECHNIQUES. - ISSN 1001-8042. - 32:10(2021). [10.1007/s41365-021-00943-6] 1-gen-2021 Azimi, SarahDe Sio, CorradoSterpone, Luca + Yang2021_Article_Single-event-effectPropagation (1).pdf
On the Analysis of Radiation-induced Failures in the AXI Interconnect Module / De Sio, C.; Azimi, S.; Sterpone, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 114:(2020), p. 113733. [10.1016/j.microrel.2020.113733] 1-gen-2020 De Sio C.Azimi S.Sterpone L. MicRel2020_CameraReady.pdf; 1-s2.0-S0026271420305400-main.pdf
Analyzing Radiation-induced Transient Errors on SRAM-based FPGAs by Propagation of Broadening Effect / DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca; Du, Boyang. - In: IEEE ACCESS. - ISSN 2169-3536. - 7:(2019), pp. 140182-140189. [10.1109/ACCESS.2019.2915136] 1-gen-2019 Corrado De SioSarah AzimiLuca SterponeBoyang Du 08708270.pdf
Radiation-induced Single Event Transient effects during the reconfiguration process of SRAM-based FPGAs / De Sio, C.; Azimi, S.; Bozzoli, L.; Du, B.; Sterpone, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - (2019). [10.1016/j.microrel.2019.06.034] 1-gen-2019 De Sio, C.Azimi, S.Bozzoli, L.Du, B.Sterpone, L. -