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New Reliable Operation Infrastructure for Dynamic, High-dependability Applications
2021 Lange, Thomas
Composing Graph Theory and Deep Neural Networks to Evaluate SEU Type Soft Error Effects
2020 Balakrishnan, A.; Lange, T.; Glorieux, M.; Alexandrescu, D.; Jenihhin, M.
Enabling Cross-Layer Reliability and Functional Safety Assessment Through ML-Based Compact Models
2020 Alexandrescu, Dan; Balakrishnan, Aneesh; Lange, Thomas; Glorieux, Maximilien
Hardware Accelerator Design with Supervised Machine Learning for Solar Particle Event Prediction in Space Applications
2020 Chen, Junchao; Lange, Thomas; Andjelkovic, Marko; Simevski, Aleksandar; Krstic, Milos
Machine Learning Clustering Techniques for Selective Mitigation of Critical Design Features
2020 Lange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca
Prediction of Solar Particle Events with SRAM-Based Soft Error Rate Monitor and Supervised Machine Learning
2020 Chen, Junchao; Lange, Thomas; Andjelkovic, Marko; Simevski, Aleksandar; Krstic, Milos
Functional Failure Rate Due to Single-Event Transients in Clock Distribution Networks
2019 Lange, Thomas; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca
Machine Learning To Tackle the Challenges of Transient and Soft Errors in Complex Circuits
2019 Lange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca
Modeling Gate-Level Abstraction Hierarchy Using Graph Convolutional Neural Networks to Predict Functional De-Rating Factors
2019 Balakrishnan, Aneesh; Lange, Thomas; Glorieux, Maximilien; Alexandrescu, Dan; Jenihhin, Maksim
On the Estimation of Complex Circuits Functional Failure Rate by Machine Learning Techniques
2019 Lange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca
The Validation of Graph Model-Based, Gate Level Low-Dimensional Feature Data for Machine Learning Applications
2019 Balakrishnan, A.; Lange, T.; Glorieux, M.; Alexandrescu, D.; Jenihhin, M.
Understanding multidimensional verification: Where functional meets non-functional
2019 Lai, Xinhui; Balakrishnan, Aneesh; Lange, Thomas; Jenihhin, Maksim; Ghasempouri, Tara; Raik, Jaan; Alexandrescu, Dan
A Novel Error Rate Estimation Approach for UltraScale+ SRAM-based FPGAs
2018 Sterpone, Luca; Azimi, Sarah; Bozzoli, Ludovica; Du, Boyang; Lange, Thomas; Maximilien, Glorieux; Dan, Alexandrescu; Cesar Boatella, Polo; MERODIO CODINACHS, David
Single-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation
2018 Glorieux, Maximilien; Evans, Adrian; Lange, Thomas; In, A-Duong; Alexandrescu, Dan; Boatella-Polo, Cesar; Garcı́a Alı́a, Rubén; Tali, Maris; Urbina Ortega, Carlos; Kastriotou, Maria; Fernández-Martı́nez, Pablo; Ferlet-Cavrois, Véronique
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| New Reliable Operation Infrastructure for Dynamic, High-dependability Applications / Lange, Thomas. - (2021 Sep 24), pp. 1-113. | 24-set-2021 | LANGE, THOMAS | conv_tl_phdthesis_2021-08-31.pdf; conv_tl_phdthesis_abstract_2021-08-31.pdf |
| Composing Graph Theory and Deep Neural Networks to Evaluate SEU Type Soft Error Effects / Balakrishnan, A.; Lange, T.; Glorieux, M.; Alexandrescu, D.; Jenihhin, M.. - (2020), pp. 1-5. (Intervento presentato al convegno 9th Mediterranean Conference on Embedded Computing, MECO 2020 tenutosi a mne nel 2020) [10.1109/MECO49872.2020.9134279]. | 1-gen-2020 | Lange T. + | 09134279.pdf |
| Enabling Cross-Layer Reliability and Functional Safety Assessment Through ML-Based Compact Models / Alexandrescu, Dan; Balakrishnan, Aneesh; Lange, Thomas; Glorieux, Maximilien. - ELETTRONICO. - (2020), pp. 1-6. (Intervento presentato al convegno 26th International Symposium on On-Line Testing And Robust System Design (IOLTS) tenutosi a Naples (Italy) nel 13-15 July 2020) [10.1109/IOLTS50870.2020.9159750]. | 1-gen-2020 | Lange, Thomas + | 09159750.pdf |
| Hardware Accelerator Design with Supervised Machine Learning for Solar Particle Event Prediction in Space Applications / Chen, Junchao; Lange, Thomas; Andjelkovic, Marko; Simevski, Aleksandar; Krstic, Milos. - (2020). (Intervento presentato al convegno 33rd International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)) [10.1109/DFT50435.2020.9250856]. | 1-gen-2020 | Thomas Lange + | 09250856.pdf |
| Machine Learning Clustering Techniques for Selective Mitigation of Critical Design Features / Lange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca. - (2020), pp. 1-7. (Intervento presentato al convegno 26th International Symposium on On-Line Testing And Robust System Design (IOLTS) tenutosi a Naples (Italy) nel 13-15 July 2020) [10.1109/IOLTS50870.2020.9159751]. | 1-gen-2020 | Lange, ThomasSterpone, Luca + | 09159751.pdf |
| Prediction of Solar Particle Events with SRAM-Based Soft Error Rate Monitor and Supervised Machine Learning / Chen, Junchao; Lange, Thomas; Andjelkovic, Marko; Simevski, Aleksandar; Krstic, Milos. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 114:(2020). [10.1016/j.microrel.2020.113799] | 1-gen-2020 | Lange, Thomas + | 1-s2.0-S0026271420304455-main.pdf |
| Functional Failure Rate Due to Single-Event Transients in Clock Distribution Networks / Lange, Thomas; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca. - ELETTRONICO. - (2019), pp. 1-6. (Intervento presentato al convegno 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) 2019) [10.1109/DTIS.2019.8735052]. | 1-gen-2019 | Lange, ThomasSterpone, Luca + | - |
| Machine Learning To Tackle the Challenges of Transient and Soft Errors in Complex Circuits / Lange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca. - ELETTRONICO. - (2019), pp. 7-14. (Intervento presentato al convegno 25th International Symposium on On-Line Testing And Robust System Design (IOLTS)) [10.1109/IOLTS.2019.8854423]. | 1-gen-2019 | Thomas LangeLuca Sterpone + | 08854423.pdf |
| Modeling Gate-Level Abstraction Hierarchy Using Graph Convolutional Neural Networks to Predict Functional De-Rating Factors / Balakrishnan, Aneesh; Lange, Thomas; Glorieux, Maximilien; Alexandrescu, Dan; Jenihhin, Maksim. - ELETTRONICO. - (2019), pp. 72-78. (Intervento presentato al convegno NASA/ESA Conference on Adaptive Hardware and Systems (AHS) 2019) [10.1109/AHS.2019.00007]. | 1-gen-2019 | Lange, Thomas + | - |
| On the Estimation of Complex Circuits Functional Failure Rate by Machine Learning Techniques / Lange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca. - ELETTRONICO. - (2019), pp. 35-41. (Intervento presentato al convegno 49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN-S) 2019) [10.1109/DSN-S.2019.00021]. | 1-gen-2019 | Lange, ThomasSterpone, Luca + | - |
| The Validation of Graph Model-Based, Gate Level Low-Dimensional Feature Data for Machine Learning Applications / Balakrishnan, A.; Lange, T.; Glorieux, M.; Alexandrescu, D.; Jenihhin, M.. - (2019), pp. 1-7. (Intervento presentato al convegno 5th IEEE Nordic Circuits and Systems Conference, NORCAS 2019: NORCHIP and International Symposium of System-on-Chip, SoC 2019 tenutosi a fin nel 2019) [10.1109/NORCHIP.2019.8906974]. | 1-gen-2019 | Lange T. + | 08906974.pdf |
| Understanding multidimensional verification: Where functional meets non-functional / Lai, Xinhui; Balakrishnan, Aneesh; Lange, Thomas; Jenihhin, Maksim; Ghasempouri, Tara; Raik, Jaan; Alexandrescu, Dan. - In: MICROPROCESSORS AND MICROSYSTEMS. - ISSN 0141-9331. - ELETTRONICO. - 71:(2019), pp. 102867-102879. [10.1016/j.micpro.2019.102867] | 1-gen-2019 | Lange, Thomas + | Understanding multidimensional verification_ Where functional meets non-functional _ Elsevier Enhanced Reader.pdf |
| A Novel Error Rate Estimation Approach for UltraScale+ SRAM-based FPGAs / Sterpone, Luca; Azimi, Sarah; Bozzoli, Ludovica; Du, Boyang; Lange, Thomas; Maximilien, Glorieux; Dan, Alexandrescu; Cesar Boatella, Polo; MERODIO CODINACHS, David. - (2018), pp. 120-126. (Intervento presentato al convegno IEEE Adaptive Hardware and Systems (AHS), 2018 NASA/ESA Conference) [10.1109/AHS.2018.8541474]. | 1-gen-2018 | STERPONE, LUCAAZIMI, SARAHBOZZOLI, LUDOVICADU, BOYANGLANGE, THOMASMERODIO CODINACHS, DAVID + | AHS2019.pdf |
| Single-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation / Glorieux, Maximilien; Evans, Adrian; Lange, Thomas; In, A-Duong; Alexandrescu, Dan; Boatella-Polo, Cesar; Garcı́a Alı́a, Rubén; Tali, Maris; Urbina Ortega, Carlos; Kastriotou, Maria; Fernández-Martı́nez, Pablo; Ferlet-Cavrois, Véronique. - ELETTRONICO. - (2018). (Intervento presentato al convegno IEEE Nuclear and Space Radiation Effects Conference). | 1-gen-2018 | Thomas Lange + | - |