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Prediction of Solar Particle Events with SRAM-Based Soft Error Rate Monitor and Supervised Machine Learning
2020 Chen, Junchao; Lange, Thomas; Andjelkovic, Marko; Simevski, Aleksandar; Krstic, Milos
Understanding multidimensional verification: Where functional meets non-functional
2019 Lai, Xinhui; Balakrishnan, Aneesh; Lange, Thomas; Jenihhin, Maksim; Ghasempouri, Tara; Raik, Jaan; Alexandrescu, Dan
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Prediction of Solar Particle Events with SRAM-Based Soft Error Rate Monitor and Supervised Machine Learning / Chen, Junchao; Lange, Thomas; Andjelkovic, Marko; Simevski, Aleksandar; Krstic, Milos. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 114:(2020). [10.1016/j.microrel.2020.113799] | 1-gen-2020 | Lange, Thomas + | 1-s2.0-S0026271420304455-main.pdf |
| Understanding multidimensional verification: Where functional meets non-functional / Lai, Xinhui; Balakrishnan, Aneesh; Lange, Thomas; Jenihhin, Maksim; Ghasempouri, Tara; Raik, Jaan; Alexandrescu, Dan. - In: MICROPROCESSORS AND MICROSYSTEMS. - ISSN 0141-9331. - ELETTRONICO. - 71:(2019), pp. 102867-102879. [10.1016/j.micpro.2019.102867] | 1-gen-2019 | Lange, Thomas + | Understanding multidimensional verification_ Where functional meets non-functional _ Elsevier Enhanced Reader.pdf |