DAMLJANOVIC, ALEKSA

DAMLJANOVIC, ALEKSA  

Dipartimento di Automatica e Informatica  

046169  

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A Benchmark Suite of RT-level Hardware Trojansfor Pipelined Microprocessor Cores / Damljanovic, Aleksa; Ruospo, Annachiara; Sanchez Sanchez, Ernesto; Squillero, Giovanni. - ELETTRONICO. - (2021). (Intervento presentato al convegno 24th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Vienna, Austria nel April 7-9). 1-gen-2021 Damljanovic, AleksaRuospo, AnnachiaraSanchez Sanchez, ErnestoSquillero, Giovanni Trojan2021_DDECS_.pdf
On NBTI-induced Aging Analysis in IEEE 1687 Reconfigurable Scan Networks / Damljanovic, Aleksa; Squillero, Giovanni; Cem Gursoy, Cemil; Jenihhin, Maksim. - ELETTRONICO. - (2019). (Intervento presentato al convegno 27th IFIP/IEEE International Conference on Very Large Scale Integration tenutosi a Cuzco, Peru nel 6-9 October 2019) [10.1109/VLSI-SoC.2019.8920313]. 1-gen-2019 Aleksa DamljanovicGiovanni Squillero + VLSISoC2019_preprint.pdf08920313.pdf
Post-Silicon Validation of IEEE 1687 Reconfigurable Scan Networks / Damljanovic, Aleksa; Jutman, Artur; Squillero, Giovanni; Tsertov, Anton. - ELETTRONICO. - (2019). (Intervento presentato al convegno 24th IEEE European Test Symposium (ETS) tenutosi a Baden-Baden, Germany nel 27-31 May 2019). 1-gen-2019 Aleksa DamljanovicGiovanni Squillero + ETS_2019_postprint.pdfETS_2019_postprint_draft.pdf
Simulation-based Equivalence Checking between IEEE 1687 ICL and RTL / Damljanovic, Aleksa; Jutman, Artur; Portolan, Michele; Ernesto, Sanchez; Squillero, Giovanni; Tsertov, Anton. - ELETTRONICO. - (2019). (Intervento presentato al convegno 50th IEEE International Test Conference, ITC 2019 tenutosi a Washington DC (USA) nel 12-14 November) [10.1109/ITC44170.2019.9000181]. 1-gen-2019 Aleksa DamljanovicErnesto SanchezGiovanni Squillero + ITC2019_preprint.pdf09000181.pdf
A New Technique to Generate Test Sequences for Reconfigurable Scan Networks / Cantoro, Riccardo; Damljanovic, Aleksa; SONZA REORDA, Matteo; Squillero, Giovanni. - ELETTRONICO. - (2018), pp. 1-9. (Intervento presentato al convegno 49th IEEE International Test Conference, ITC 2018 tenutosi a Phoenix, Arizona (USA) nel 28 October - 2 November 2018) [10.1109/TEST.2018.8624742]. 1-gen-2018 Riccardo CantoroDAMLJANOVIC, ALEKSAMatteo Sonza ReordaGiovanni Squillero ITC2018_postprint_draft.pdf
A Semi-Formal Technique to Generate Effective Test Sequences for Reconfigurable Scan Networks / Cantoro, Riccardo; Damljanovic, Aleksa; SONZA REORDA, Matteo; Squillero, Giovanni. - STAMPA. - 2018:(2018), pp. 55-60. (Intervento presentato al convegno 2nd IEEE International Test Conference in Asia, ITC-Asia 2018 tenutosi a Harbin (PRC) nel 15-17 Agosto 2018) [10.1109/ITC-Asia.2018.00020]. 1-gen-2018 Riccardo CantoroAleksa DamljanovicMatteo Sonza ReordaGiovanni Squillero ITC_ASIA2018_postprint_draft.pdfITC_ASIA_2018_postprint.pdf
An Embedded Cascade SVM Approach for face detection in the IoT Edge Layer / Damljanovic, Aleksa; Lanza-Gutiérrez, José M.. - ELETTRONICO. - (2018), pp. 2809-2814. (Intervento presentato al convegno The 44th Annual Conference of IEEE Industrial Electronics Society, IECON 2018 tenutosi a Washington DC (USA) nel 21-23 October, 2018). 1-gen-2018 Aleksa Damljanovic + -