FLORIDIA, ANDREA

FLORIDIA, ANDREA  

Dipartimento di Automatica e Informatica  

045338  

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Targeting different defect-oriented fault models in IC testing: an experimental approach / Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza Reorda, Matteo. - ELETTRONICO. - (In corso di stampa), pp. 1-6. (Intervento presentato al convegno 26th Euromicro Conference Series on Digital System Design (DSD) tenutosi a Durres (ALB) nel 6-8 September, 2023). In corso di stampa Mirabella,NunzioFloridia, AndreaCantoro, RiccardoGrosso, MichelangeloSonza Reorda, Matteo DSD_Conference_paper_1.9_submitted.docx2023172914.pdf
A comparative overview of ATPG flows targeting traditional and cell-aware fault models / Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza Reorda, Matteo. - ELETTRONICO. - (2022), pp. 1-4. (Intervento presentato al convegno 29th IEEE International Conference on Electronics Circuits and Systems (ICECS) tenutosi a Glasgow nel 24th - 26th October 2022) [10.1109/ICECS202256217.2022.9971003]. 1-gen-2022 Mirabella, NunzioFloridia, AndreaCantoro, RiccardoGrosso, MichelangeloSonza Reorda, Matteo ICECS_2022_1.2.pdfConference_paper_1.2_submitted.docxA_comparative_overview_of_ATPG_flows_targeting_traditional_and_cell-aware_fault_models.pdf
Recent Trends and Perspectives on Defect-Oriented Testing / Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; Gielen, G.; Gomez, J.; Grosso, M.; Guerriero, A. M.; Guglielminetti, I.; Hamdioui, S.; Insinga, G.; Mautone, N.; Mirabella, N.; Sartoni, S.; Sonza Reorda, M.; Ullmann, R.; Vanhooren, R.; Xama, N.; Wu, L.. - (2022). (Intervento presentato al convegno The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Torino (Italy) nel 12-14 September 2022) [10.1109/IOLTS56730.2022.9897647]. 1-gen-2022 P. BernardiR. CantoroA. FloridiaM. GrossoS. HamdiouiG. InsingaN. MirabellaS. SartoniM. Sonza ReordaL. Wu + _IOLTS2022__Special_Session__Recent_Trends_and_Perspectives_on_Defect_Oriented_Testing.pdfRecent_Trends_and_Perspectives_on_Defect-Oriented_Testing.pdf
A JTAG-based Fault Emulation Platform for Dependability Analyses of Processor-based ASICs / Floridia, Andrea; Sanchez Sanchez, Ernesto. - ELETTRONICO. - 2021 12th IEEE Latin America Symposium on Circuits and System:(2021), pp. 1-4. (Intervento presentato al convegno 12th IEEE Latin America Symposium on Circuits and System tenutosi a Arequipa (Perú) nel February 21-25, 2021). 1-gen-2021 Floridia, AndreaSanchez Sanchez, Ernesto A_JTAG-based_Fault_Emulation_Platform_for_Dependability_Analyses_of_Processor-based_ASICs.pdf
A Suitability analysis of software based testing strategies for the on-line testing of artificial neural networks applications in embedded devices / Ruospo, A.; Piumatti, D.; Floridia, A.; Sanchez, E.. - ELETTRONICO. - (2021), pp. 1-6. (Intervento presentato al convegno 27th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2021 tenutosi a Torino, Italy nel 2021) [10.1109/IOLTS52814.2021.9486704]. 1-gen-2021 Ruospo A.Piumatti D.Floridia A.Sanchez E. FINAL_PUBLISHED.pdf
Self-Test Mechanisms for Automotive Multi-Processor System-on-Chips / Floridia, Andrea. - (2021 Sep 23), pp. 1-134. 23-set-2021 FLORIDIA, ANDREA conv_tesi_dottorato_final.pdfconv_abstract.pdf
Deterministic Cache-based Execution of On-line Self-Test Routines in Multi-core Automotive System-on-Chips / Floridia, Andrea; Carmona, Tzamn Melendez; Piumatti, Davide; Ruospo, Annachiara; Sanchez, Ernesto; Luca, Sergio De; Martorana, Rosario; Pernice, Mose Alessandro. - ELETTRONICO. - (2020), pp. 1235-1240. (Intervento presentato al convegno 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) tenutosi a Grenoble, France nel 9-13 March, 2020) [10.23919/DATE48585.2020.9116239]. 1-gen-2020 Floridia, AndreaPiumatti, DavideRuospo, AnnachiaraSanchez, Ernesto + DATE_CACHES.pdfpost_print_IEEE.pdf
On-line Self-test Mechanism for Dual-Core Lockstep System-on-Chips / Floridia, Andrea; Sanchez, Ernesto. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 112C:(2020), pp. 1-10. [10.1016/j.microrel.2020.113770] 1-gen-2020 Floridia, AndreaSanchez, Ernesto manuscript_word.pdf1-s2.0-S0026271420300317-main.pdf
A Decentralized Scheduler for On-line Self-test Routines in Multi-core Automotive System-on-Chips / Floridia, Andrea; Piumatti, Davide; Ruospo, Annachiara; Ernesto, Sanchez; Sergio De Luca, ; Rosario, Martorana. - ELETTRONICO. - (2019), pp. 1-10. (Intervento presentato al convegno 2019 IEEE International Test Conference (ITC) tenutosi a Washington (USA) nel 9 - 15 November, 2019) [10.1109/ITC44170.2019.9000129]. 1-gen-2019 Andrea FloridiaDavide PiumattiRUOSPO, ANNACHIARAErnesto Sanchez + pre_print_IEEE.pdfpost_print_IEEE.pdf
An analysis of test solutions for COTS-based systems in space applications / Cantoro, Riccardo; Carbonara, Sara; Floridia, Andrea; Ernesto, Sanchez; SONZA REORDA, Matteo; Jan-Gerd, Mess. - ELETTRONICO. - IEEE VLSI-SOC 2018:(2019), pp. 1-6. (Intervento presentato al convegno 2018 IFIP/IEEE 26th International Conference on Very Large Scale Integration (VLSI-SOC) tenutosi a Verona (Italy) nel 8-10 Ottobre 2018) [10.1109/VLSI-SoC.2018.8644846]. 1-gen-2019 Riccardo CantoroCARBONARA, SARAAndrea FloridiaErnesto SanchezMatteo Sonza Reorda + -
Correction to: Improved Test Solutions for COTS-Based Systems in Space Applications / Cantoro, Riccardo; Carbonara, Sara; Floridia, Andrea; Sanchez, Ernesto; Sonza Reorda, Matteo; Mess, Jan-Gerd (IFIP ADVANCES IN INFORMATION AND COMMUNICATION TECHNOLOGY). - In: VLSI-SoC: Design and Engineering of Electronics Systems Based on New Computing ParadigmsELETTRONICO. - [s.l] : Springer, Cham, 2019. - ISBN 978-3-030-23424-9. - pp. 187-206 [10.1007/978-3-030-23425-6_14] 1-gen-2019 Cantoro, RiccardoCarbonara, SaraFloridia, AndreaSanchez, ErnestoSonza Reorda, Matteo + -
Fault Grading Techniques of Software Test Libraries for Safety-Critical Applications / Floridia, Andrea; Sanchez, Ernesto; Sonza Reorda, Matteo. - In: IEEE ACCESS. - ISSN 2169-3536. - ELETTRONICO. - 7:(2019), pp. 63578-63587. [10.1109/ACCESS.2019.2917036] 1-gen-2019 Floridia, AndreaSanchez, ErnestoSonza Reorda, Matteo 08715776.pdf
Hybrid on-line self-test architecture for computational units on embedded processor cores / Floridia, Andrea; Mongano, Gianmarco; Piumatti, Davide; Sanchez, Ernesto. - IEEE DDECS19:(2019), pp. 1-6. (Intervento presentato al convegno Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Cluj-Napoca nel April 24-26, 2019) [10.1109/DDECS.2019.8724647]. 1-gen-2019 Floridia, AndreaPiumatti, DavideSanchez, Ernesto + -
Hybrid on-line self-test strategy for dual-core lockstep processors / Floridia, Andrea; Ernesto, Sanchez. - ELETTRONICO. - 2018:(2019), pp. 1-6. (Intervento presentato al convegno 2018 IEEE 31st International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) tenutosi a Chicago (USA) nel 8-10 Ottobre 2018) [10.1109/DFT.2018.8602982]. 1-gen-2019 FLORIDIA, ANDREAErnesto Sanchez -
Increasing the Robustness of Software Test Libraries in Multi-core System-on-Chips / Floridia, Andrea; Piumatti, Davide; Ruospo, Annachiara; Ernesto, Sanchez; Martorana, Rosario; Alessandro Pernice, Mose. - ART 2019:(2019). (Intervento presentato al convegno ART 2019 tenutosi a Washington d.c. nel 14-15 November 2019). 1-gen-2019 Andrea FloridiaDavide PiumattiAnnachiara RuospoErnesto Sanchez + -
Non-Intrusive Self-Test Library for Automotive Critical Applications: Constraints and Solutions / Bernardi, P.; Cantoro, R.; Floridia, A.; Piumatti, D.; Pogonea, C.; Ruospo, A.; Sanchez, E.; De Luca, S.; Sansonetti, A.. - IEEE DATE 2019:(2019), pp. 920-923. (Intervento presentato al convegno Design, Automation and Test in Europe; DATE 2019) [10.23919/DATE.2019.8714780]. 1-gen-2019 Bernardi, P.Cantoro, R.Floridia, A.Piumatti, D.Ruospo, A.Sanchez, E. + -
Analysis of Fault Simulations Result during development of a Software Test Library / Floridia, A.; Piumatti, D.; Ruospo, Annachiara; Sanchez, E.. - ELETTRONICO. - ART 2018:(2018). (Intervento presentato al convegno ART 2018 tenutosi a Phoenix, Arizona, USA nel November 01-02, 2018.). 1-gen-2018 A. FloridiaD. PiumattiRUOSPO, ANNACHIARAE. Sanchez -
Development flow of on-line Software Test Libraries for asynchronous processor cores / Floridia, Andrea; Ernesto, Sanchez; Andrikos, Nikos. - ELETTRONICO. - 2018:(2018). (Intervento presentato al convegno 2018 IEEE 24th International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Platja d’Aro (Spain) nel 2-4 July 2018) [10.1109/IOLTS.2018.8474126]. 1-gen-2018 Andrea FloridiaErnesto Sanchez + -
Parallel software-based self-test suite for multi-core system-on-chip: Migration from single-core to multi-core automotive microcontrollers / Floridia, A.; Piumatti, D.; Sanchez, E.; De Luca, S.; Sansonetti, A.. - STAMPA. - (2018), pp. 1-6. (Intervento presentato al convegno 2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) tenutosi a Taormina, Italy nel 9-12 April 2018) [10.1109/DTIS.2018.8368558]. 1-gen-2018 Floridia, A.Piumatti, D.Sanchez, E. + -
Problems of a Software Test Library for Multicore System-On-Chip / Bernardi, P.; Floridia, A.; Piumatti, D.; Sanchez, E.; De Luca, S.; Sansonetti, A.. - STAMPA. - Proceedings of the 6 th Prague Embedded Systems Workshop:PESW2018(2018), pp. 4-5. (Intervento presentato al convegno 6 th Prague Embedded Systems Workshop tenutosi a Praga nel June 28-30, 2018). 1-gen-2018 P. BernardiA. FloridiaD. PiumattiE. Sanchez + -