RUOSPO, ANNACHIARA

RUOSPO, ANNACHIARA  

Dipartimento di Automatica e Informatica  

041203  

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Model theft attack against a tinyML application running on an Ultra-Low-Power Open-Source SoC / Porsia, Antonio; Ruospo, Annachiara; Sanchez, Ernesto. - (In corso di stampa). (Intervento presentato al convegno 21st ACM International Conference on Computing Frontiers Workshops and Special Sessions (CF '24 Companion)). In corso di stampa Porsia, AntonioRuospo, AnnachiaraSanchez, Ernesto OSHW24.pdf
Resiliency approaches in Convolutional, Photonic, and Spiking Neural Networks / Bosio, Alberto; Gomes, Mauricio; Pavanello, Fabio; Porsia, Antonio; Ruospo, Annachiara; Sanchez, Ernesto; Vatajelu, Elena Ioana. - (In corso di stampa). (Intervento presentato al convegno 25th IEEE Latin American Test Symposium (LATS)). In corso di stampa Bosio, AlbertoPavanello, FabioPorsia, AntonioRuospo, AnnachiaraSanchez, ErnestoVatajelu, Elena Ioana + LATS24_SpecialSession.pdf
A Fast Reliability Analysis of Image Segmentation Neural Networks Exploiting Statistical Fault Injections / Gavarini, G; Ruospo, A; Sanchez, E. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE 24th Latin American Test Symposium (LATS) tenutosi a Veracruz (Mexico) nel 21-24 March 2023) [10.1109/LATS58125.2023.10154488]. 1-gen-2023 Gavarini, GRuospo, ASanchez, E A_Fast_Reliability_Analysis_of_Image_Segmentation_Neural_Networks_Exploiting_Statistical_Fault_Injections.pdf
A Fault Injection Framework for AI Hardware Accelerators / Pappalardo, S; Ruospo, A; O'Connor, I; Deveautour, B; Sanchez, E; Bosio, A. - ELETTRONICO. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE 24th Latin American Test Symposium (LATS) tenutosi a Veracruz, Mexico nel 21-24 March 2023) [10.1109/LATS58125.2023.10154505]. 1-gen-2023 Ruospo, ASanchez, E + _LATS23__A_Fault_Injection_Framework_for_AI_Hardware_Accelerators.pdfA_Fault_Injection_Framework_for_AI_Hardware_Accelerators.pdf
A Survey on Deep Learning Resilience Assessment Methodologies / Ruospo, Annachiara; Sanchez, Ernesto; Matana Luza, Lucas; Dilillo, Luigi; Traiola, Marcello; Bosio, Alberto. - In: COMPUTER. - ISSN 0018-9162. - ELETTRONICO. - 56:2(2023), pp. 57-66. [10.1109/MC.2022.3217841] 1-gen-2023 Ruospo, AnnachiaraSanchez, Ernesto + A_Survey_on_Deep_Learning_Resilience_Assessment_Methodologies_CR.pdfA_Survey_on_Deep_Learning_Resilience_Assessment_Methodologies.pdf
Assessing Convolutional Neural Networks Reliability through Statistical Fault Injections / Ruospo, Annachiara; Gavarini, Gabriele; De Sio, Corrado; Guerrero Balaguera, Juan David; Sterpone, Luca; Sonza Reorda, Matteo; Sanchez, Ernesto; Mariani, Riccardo; Aribido, Joseph; Athavale, Jyotika. - (2023), pp. 1-6. (Intervento presentato al convegno IEEE Design, Automation and Test in Europe Conference (DATE) tenutosi a Antwerp (Belgium) nel 17 - 19 April 2023) [10.23919/DATE56975.2023.10136998]. 1-gen-2023 Ruospo, AnnachiaraGavarini, GabrieleDe Sio, CorradoGuerrero Balaguera, Juan DavidSterpone, LucaSonza Reorda, MatteoSanchez, Ernesto + date_2023_acceptedVersion.pdfAssessing_Convolutional_Neural_Networks_Reliability_through_Statistical_Fault_Injections.pdf
Evaluation and mitigation of faults affecting Swin Transformers / Gavarini, Gabriele; Ruospo, Annachiara; Sanchez, Ernesto. - ELETTRONICO. - (2023), pp. 1-7. (Intervento presentato al convegno 29th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2023) tenutosi a Chania,Crete (Greece) nel July 3rd - 5th, 2023) [10.1109/IOLTS59296.2023.10224882]. 1-gen-2023 Gabriele GavariniAnnachiara RuospoErnesto Sanchez IOLTS23_TransformerCaseStudy.pdfEvaluation_and_Mitigation_of_Faults_Affecting_Swin_Transformers.pdf
Image Test Libraries for the on-line self-test of functional units in GPUs running CNNs / Ruospo, Annachiara; Gavarini, Gabriele; Porsia, Antonio; Sonza Reorda, Matteo; Sanchez, Ernesto; Mariani, Riccardo; Aribido, Joseph; Athavale, Jyotika. - (2023), pp. 1-6. (Intervento presentato al convegno 28th IEEE European Test Symposium 2023 tenutosi a Venice (Italy) nel May 22 - 26, 2023) [10.1109/ETS56758.2023.10174176]. 1-gen-2023 Ruospo, AnnachiaraGavarini, GabrielePorsia, AntonioSonza Reorda, MatteoSanchez, Ernesto + OnlineTestImages_ETS23.pdfImage_Test_Libraries_for_the_on-line_self-test_of_functional_units_in_GPUs_running_CNNs.pdf
On the resilience of representative and novel data formats in CNNs / Gavarini, G.; Ruospo, A.; Sanchez, E.. - (2023). (Intervento presentato al convegno International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems tenutosi a Juan-Les-Pins (FR) nel 03-05 October 2023) [10.1109/DFT59622.2023.10313551]. 1-gen-2023 Gavarini G.Ruospo A.Sanchez E. On_the_resilience_of_representative_and_novel_data_formats_in_CNNs.pdf
Resilience-Performance Tradeoff Analysis of a Deep Neural Network Accelerator / Pappalardo, S; Ruospo, A; O'Connor, I; Deveautour, B; Sanchez, E; Bosio, A. - (2023), pp. 181-186. (Intervento presentato al convegno 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Tallin, Estonia nel 03-05 May 2023) [10.1109/DDECS57882.2023.10139704]. 1-gen-2023 Ruospo, ASanchez, E + _DDECS__Resilence_Performance_Tradeoff_Analisys_of_Deep_Neural_Network_Accelerator.pdfResilience-Performance_Tradeoff_Analysis_of_a_Deep_Neural_Network_Accelerator.pdf
SCI-FI: a Smart, aCcurate and unIntrusive Fault-Injector for Deep Neural Networks / Gavarini, G; Ruospo, A; Sanchez, E. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (Italy) nel 22-26 May 2023) [10.1109/ETS56758.2023.10173957]. 1-gen-2023 Gavarini, GRuospo, ASanchez, E SCI-FI_a_Smart_aCcurate_and_unIntrusive_Fault-Injector_for_Deep_Neural_Networks.pdf
Special Session: Approximation and Fault Resiliency of DNN Accelerators / Ahmadilivani, Mh; Barbareschi, M; Barone, S; Bosio, A; Daneshtalab, M; Della Torca, S; Gavarini, G; Jenihhin, M; Raik, J; Ruospo, A; Sanchez, E; Taheri, M. - (2023), pp. 1-10. (Intervento presentato al convegno 2023 IEEE 41st VLSI Test Symposium (VTS) tenutosi a San Diego (USA) nel 24-26 April 2023) [10.1109/VTS56346.2023.10140043]. 1-gen-2023 Barone, SBosio, AGavarini, GRuospo, ASanchez, E + Special_Session_Approximation_and_Fault_Resiliency_of_DNN_Accelerators.pdf
Uncovering hidden vulnerabilities in CNNs through evolutionary-based Image Test Libraries / Turco, V.; Ruospo, A.; Gavarini, G.; Sanchez, E.; Sonza Reorda, M.. - (2023). (Intervento presentato al convegno International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems tenutosi a Juan-Les-Pins (FR) nel 03-05 October 2023) [10.1109/DFT59622.2023.10313530]. 1-gen-2023 V. TurcoA. RuospoG. GavariniE. SanchezM. Sonza Reorda Uncovering_hidden_vulnerabilities_in_CNNs_through_evolutionary-based_Image_Test_Libraries.pdf
Design, Verification, Test, and In-Field Implications of Approximate Digital Integrated Circuits / Bosio, Alberto; Di Carlo, Stefano; Girard, Patrick; Ruospo, Annachiara; Sanchez, Ernesto; Savino, Alessandro; Sekanina, Lukas; Traiola, Marcello; Vasicek, Zdenek; Virazel, Arnaud - In: Approximate Computing Techniques From Component- to Application-Level / Bosio A., Ménard D., Sentieys O.. - STAMPA. - [s.l] : Springer Nature, 2022. - ISBN 978-3-030-94704-0. - pp. 349-385 [10.1007/978-3-030-94705-7_12] 1-gen-2022 Bosio, AlbertoDi Carlo, StefanoRuospo, AnnachiaraSanchez, ErnestoSavino, Alessandro + chapter12.pdfprinted-chapter.pdf
Machine Learning for Hardware Security: Classifier-based Identification of Trojans in Pipelined Microprocessors / Damljanovic, Aleksa; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni. - In: APPLIED SOFT COMPUTING. - ISSN 1568-4946. - ELETTRONICO. - 116:(2022), pp. 1-16. [10.1016/j.asoc.2021.108068] 1-gen-2022 Aleksa DamljanovicAnnachiara RuospoErnesto SanchezGiovanni Squillero HT_ML_Elsevier.pdf1-s2.0-S1568494621009753-main.pdf
Open-Set Recognition: an Inexpensive Strategy to Increase DNN Reliability / Gavarini, Gabriele; Stucchi, Diego; Ruospo, Annachiara; Boracchi, Giacomo; Sanchez, Ernesto. - ELETTRONICO. - (2022). (Intervento presentato al convegno The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2022) tenutosi a Torino nel September, 12th-14th 2022) [10.1109/IOLTS56730.2022.9897805]. 1-gen-2022 Gavarini, GabrieleRuospo, AnnachiaraSanchez, Ernesto + postPrintIOLTS.pdfOpen-Set_Recognition_an_Inexpensive_Strategy_to_Increase_DNN_Reliability.pdf
Reliability and Security Assessment of Modern Embedded Devices / Ruospo, Annachiara. - (2022 Jul 05), pp. 1-193. 5-lug-2022 RUOSPO, ANNACHIARA conv_phd_thesis.pdfconv_phd_thesis_summary.pdf
Reliability Assessment Methodologies for ANN-based Systems / Ruospo, A.. - (2022), pp. 1-4. (Intervento presentato al convegno 23rd IEEE Latin American Test Symposium, LATS 2022 tenutosi a Montevideo (Uruguay) nel 05-08 September 2022) [10.1109/LATS57337.2022.9936917]. 1-gen-2022 Ruospo A. lats_2022_final.pdf
Selective Hardening of Critical Neurons in Deep Neural Networks / Ruospo, Annachiara; Gavarini, Gabriele; Bragaglia, Ilaria; Traiola, Marcello; Bosio, Alberto; Sanchez, Ernesto. - ELETTRONICO. - (2022), pp. 136-141. (Intervento presentato al convegno 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems – DDECS 2022 tenutosi a Prague, Czech Republic nel April 6 – 8, 2022) [10.1109/DDECS54261.2022.9770168]. 1-gen-2022 Ruospo, AnnachiaraGavarini, GabrieleSanchez, Ernesto + DDECS_2022__TMR_critical_neurons.pdfSelective_Hardening_of_Critical_Neurons_in_Deep_Neural_Networks.pdf
Test, Reliability and Functional Safety trends for Automotive System-on-Chip / Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; de Sio, C.; Foscale, T.; Gavarini, G.; Huch, M.; Kilian, T; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.. - (2022). (Intervento presentato al convegno IEEE European Test Symposium). 1-gen-2022 F. AngioneN. BellarminoP. BernardiR. CantoroC. de SioT. FoscaleG. GavariniA. RuospoE. SanchezG. SquilleroM. Sonza ReordaL. Sterpone + 01_ETS_special_session_ABSTRACT.pdf