AZIMI, SARAH

AZIMI, SARAH  

Dipartimento di Automatica e Informatica  

039557  

Mostra records
Risultati 1 - 20 di 61 (tempo di esecuzione: 0.027 secondi).
Citazione Data di pubblicazione Autori File
FireNN: Neural Networks Reliability Evaluation on Hybrid Platforms / De Sio, C.; Azimi, S.; Sterpone, L.. - In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING. - ISSN 2168-6750. - ELETTRONICO. - 10:2(2022), pp. 549-563. [10.1109/TETC.2022.3152668] 1-gen-2022 De Sio C.Azimi S.Sterpone L. FireNN_cd_2.2.pdfFireNN_Neural_Networks_Reliability_Evaluation_on_Hybrid_Platforms.pdf
On the Reliability of Real-time Operating System on Embedded Soft Processor for Space Applications / Portaluri, Andrea; Azimi, Sarah; DE SIO, Corrado; Rizzieri, Daniele; Sterpone, Luca. - ELETTRONICO. - (2022), pp. 1-14. ((Intervento presentato al convegno 35th GI/ITG International Conference on Architecture of Computing Systems tenutosi a Heilbronn (Germany) nel September, 2022. 1-gen-2022 Andrea PortaluriSarah AzimiCorrado De SioDaniele RizzieriLuca Sterpone paper_26.pdf
Analysis and Mitigation of Soft-Errors on High Performance Embedded GPUs / Sterpone, L.; Azimi, S.; De Sio, C.; Parisi, F.. - ELETTRONICO. - (2022), pp. 91-98. ((Intervento presentato al convegno 21st IEEE International Symposium on Parallel and Distributed Computing tenutosi a Basel (Switzerland) nel 11-13 July 2022 [10.1109/ISPDC55340.2022.00022]. 1-gen-2022 L. SterponeS. AzimiC. De Sio + ISPDC_2022.pdfAnalysis_and_Mitigation_of_Soft-Errors_on_High_Performance_Embedded_GPUs.pdf
Analysis of Proton-induced Single Event Effect in the On-Chip Memory of Embedded Processor / DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca; Merodio Codinachs, David. - ELETTRONICO. - (2022), pp. 1-6. ((Intervento presentato al convegno IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) tenutosi a Austin (USA) nel October, 2022 [10.1109/DFT56152.2022.9962341]. 1-gen-2022 Corrado De SioSarah AzimiLuca Sterpone + DFT22_v2.2_cready.pdfAnalysis_of_Proton-induced_Single_Event_Effect_in_the_On-Chip_Memory_of_Embedded_Process.pdf
A Comparative Radiation Analysis of Reconfigurable Memory Technologies: FinFET versus Bulk CMOS / Azimi, S.; De Sio, C.; Portaluri, A.; Rizzieri, D.; Sterpone, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 138:(2022), pp. 1-5. [10.1016/j.microrel.2022.114733] 1-gen-2022 S. AzimiC. De SioA. PortaluriD. RizzieriL. Sterpone MicRel_CMOSvsFinFET_V3_fin.pdf1-s2.0-S0026271422002578-main.pdf
Failure rate analysis of radiation tolerant design techniques on SRAM-based FPGAs / Vacca, Eleonora; Azimi, Sarah; Sterpone, Luca. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 138:(2022). [10.1016/j.microrel.2022.114778] 1-gen-2022 Vacca, EleonoraAzimi, SarahSterpone, Luca microelectronics_reliability_camera_ready.pdf3220228.3220229.pdf
A Placement-Oriented Mitigation Technique for Single Event Effect in Monolithic 3D IC / Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - ELETTRONICO. - (2022), pp. 1-4. ((Intervento presentato al convegno IEEE International Conference on Synthesis, modeling, analysis and Simulation methods and applications to circuit design - SMACD 2022 tenutosi a Sardinia, Italy nel June 2022 [10.1109/SMACD55068.2022.9816235]. 1-gen-2022 Azimi, SarahDe Sio, CorradoSterpone, Luca SMACD_CameraReady.pdfA_Placement-Oriented_Mitigation_Technique_for_Single_Event_Effect_in_Monolithic_3D_IC.pdf
Soft Error Reliability Prediction of SRAM-based FPGA Designs / Vacca, Eleonora; Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Sterpone, Luca; Merodio Codinachs, David; Poivey, Christian. - ELETTRONICO. - (2022), pp. 1-4. ((Intervento presentato al convegno IEEE Radiation and its Effects on Components and Systems 2022 tenutosi a Venice (Italy) nel October, 2022. 1-gen-2022 Eleonora VaccaSarah AzimiCorrado De SioAndrea PortaluriDaniele RizzieriLuca Sterpone + RADECS_prediction_v6 (2).pdf
Proton-induced MBU Effects in Real-time Operating System on Embedded Soft Processor / De Sio, Corrado; Azimi, Sarah; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David. - ELETTRONICO. - (2022), pp. 1-4. ((Intervento presentato al convegno IEEE Radiation and its Effects on Components and Systems 2022. 1-gen-2022 De Sio, CorradoAzimi SarahPortaluri AndreaRizzieri, DanieleVacca, EleonoraSterpone, Luca + RADECS2022_Final.pdf
SEU Mitigation on SRAM-based FPGAs through Domains-based Isolation Design Flow / Portaluri, Andrea; De Sio, Corrado; Azimi, Sarah; Sterpone, Luca. - ELETTRONICO. - (2022). ((Intervento presentato al convegno IEEE Radiation and its Effects on Components and Systems 2021 tenutosi a Vienna (Austria) nel 13-17 September 2021 [10.1109/RADECS53308.2021.9954492]. 1-gen-2022 Portaluri,AndreaDe Sio,CorradoAzimi,SarahSterpone,Luca RADECS-Camera Ready.pdfSEU_Mitigation_on_SRAM-based_FPGAs_through_Domains-based_Isolation_Design_Flow.pdf
Design and Mitigation techniques of Radiation induced SEEs on Open-Source Embedded Static RAMs / Azimi, S.; De Sio, C.; Portaluri, A.; Sterpone, L. - In: VLSI-SoC[s.l] : Springer, 2022. 1-gen-2022 S. AzimiC. De SioA. PortaluriL. Sterpone springer_book_extended_vlsi_soc_2021_final.pdf
An Automated Continuous Integration Multitest Platform for Automotive Systems / Du, Boyang; Azimi, Sarah; Moramarco, Annarita; Sabena, Davide; Parisi, Filippo; Sterpone, Luca. - In: IEEE SYSTEMS JOURNAL. - ISSN 1932-8184. - ELETTRONICO. - 16:2(2022), pp. 2495-2506. [10.1109/JSYST.2021.3069548] 1-gen-2022 Du, BoyangAzimi, SarahMoramarco, AnnaritaSabena, DavideSterpone, Luca + IEEESystem_2021.pdfAn_Automated_Continuous_Integration_Multitest_Platform_for_Automotive_Systems.pdf
Layout-oriented Radiation Effects Mitigation in RISC-V Soft Processor / Vacca, Eleonora; De Sio, Corrado; Azimi, Sarah. - ELETTRONICO. - (2022), pp. 1-6. ((Intervento presentato al convegno 19th ACM International Conference on Computing Frontiers 2022 tenutosi a Torino nel May 2022 [10.1145/3528416.3530984]. 1-gen-2022 Vacca, EleonoraDe Sio, CorradoAzimi, Sarah CF2022_camera_ready.pdf3528416.3530984.pdf
Radiation-induced Effects on DMA Data Transfer in Reconfigurable Devices / Portaluri, Andrea; Azimi, Sarah; De Sio, Corrado; Sterpone, Luca; Merodio Codinachs, David. - ELETTRONICO. - (2022), pp. 1-7. ((Intervento presentato al convegno IEEE The 28th International Symposium on On-Line Testing and Robust System Design (IOLTS 2022) tenutosi a Turin nel 12-14 September 2022 [10.1109/IOLTS56730.2022.9897262]. 1-gen-2022 Portaluri, AndreaAzimi, SarahDe Sio, CorradoSterpone, Luca + IOLTS_22_paper.pdf
Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis / Yang, Wei-Tao; Du, Xue-Cheng; Li, Yong-Hong; He, Chao-Hui; Guo, Gang; Shi, Shu-Ting; Cai, Li; Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - In: NUCLEAR SCIENCE AND TECHNIQUES. - ISSN 1001-8042. - 32:10(2021). [10.1007/s41365-021-00943-6] 1-gen-2021 Azimi, SarahDe Sio, CorradoSterpone, Luca + Yang2021_Article_Single-event-effectPropagation (1).pdf
A Radiation-Hardened CMOS Full-Adder Based on Layout Selective Transistor Duplication / Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - In: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. - ISSN 1063-8210. - ELETTRONICO. - 29:8(2021), pp. 1596-1600. [10.1109/TVLSI.2021.3086897] 1-gen-2021 Azimi, SarahDe Sio, CorradoSterpone, Luca ToVLSI-Final Version.pdfA_Radiation-Hardened_CMOS_Full-Adder_Based_on_Layout_Selective_Transistor_Duplication.pdf
Analysis of Single Event Effects on Embedded Processor / Azimi, Sarah; De Sio, Corrado; Rizzieri, Daniele; Sterpone, Luca. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 10:24(2021), p. 3160. [10.3390/electronics10243160] 1-gen-2021 Azimi, SarahDe Sio, CorradoRizzieri, DanieleSterpone, Luca electronics-10-03160 (1).pdf
SEU Evaluation of Hardened-by-Replication Software in RISC-V Soft Processor / De Sio, Corrado; Azimi, Sarah; Portaluri, Andrea; Sterpone, Luca. - ELETTRONICO. - (2021), pp. 1-6. ((Intervento presentato al convegno IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) tenutosi a Athens (GR) nel 6-8 October 2019 [10.1109/DFT52944.2021.9568342]. 1-gen-2021 De Sio, CorradoAzimi, SarahPortaluri, AndreaSterpone, Luca DFT_CAMERA READY.pdfSEU_Evaluation_of_Hardened-by-Replication_Software_in_RISC-_V_Soft_Processor.pdf
On the Evaluation of SEEs on Open-Source Embedded Static RAMs / Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - ELETTRONICO. - (2021), pp. 1-6. ((Intervento presentato al convegno IEEE International Conference on Very Large Scale Integration (VLSI-SoC) nel 4-7 October 2021 [10.1109/VLSI-SoC53125.2021.9606985]. 1-gen-2021 Azimi, SarahDe Sio, CorradoSterpone, Luca VLSI-SoC Camera Ready.pdfOn_the_Evaluation_of_SEEs_on_Open-Source_Embedded_Static_RAMs.pdf
A 3-D LUT Design for Transient Error Detection Via Inter-Tier In-Silicon Radiation Sensor / Azimi, Sarah; DE SIO, Corrado; Sterpone, Luca. - ELETTRONICO. - (2021), pp. 1-6. ((Intervento presentato al convegno Design, Automation and Test in Europe Conference (DATE2021) nel February 2021. 1-gen-2021 Sarah AzimiCorrado De SioLuca Sterpone DATE 2021- Camera Ready.pdfA_3-D_LUT_Design_for_Transient_Error_Detection_Via_Inter-Tier_In-Silicon_Radiation_Sensor.pdf