CANTORO, RICCARDO

CANTORO, RICCARDO  

Dipartimento di Automatica e Informatica  

021727  

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Risultati 1 - 20 di 67 (tempo di esecuzione: 0.037 secondi).
Citazione Data di pubblicazione Autori File
Evaluating the Reliability of Integer Multipliers With Respect to Permanent Faults / Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Habib, S. E. D.. - (In corso di stampa). (Intervento presentato al convegno International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)). In corso di stampa Deligiannis, NikolaosCantoro, RiccardoSonza Reorda Matteo + DDECS2024__Evaluating_the_Reliability_of_Integer_Multipliers_With_Respect_to_Permanent_Faults.pdf
Targeting different defect-oriented fault models in IC testing: an experimental approach / Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza Reorda, Matteo. - ELETTRONICO. - (In corso di stampa), pp. 1-6. (Intervento presentato al convegno 26th Euromicro Conference Series on Digital System Design (DSD) tenutosi a Durres (ALB) nel 6-8 September, 2023). In corso di stampa Mirabella,NunzioFloridia, AndreaCantoro, RiccardoGrosso, MichelangeloSonza Reorda, Matteo DSD_Conference_paper_1.9_submitted.docx2023172914.pdf
Transfer Learning in MCU Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - ELETTRONICO. - (In corso di stampa). (Intervento presentato al convegno IEEE International Test Conference (ITC 2023) tenutosi a Anaheim, CA 92802, Stati Uniti nel 8-13 Ottobre 2023). In corso di stampa Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + 2023_XXX_Transfer_Learning_POSTER (5).pdf
A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors / Anders, Jens; Andreu, Pablo; Becker, Bernd; Becker, Steffen; Cantoro, Riccardo; Deligiannis, Nikolaos; Elhamawy, Nourhan; Faller, Tobias; Hernandez, Carles; Mentens, Nele; Namazi Rizi, Mahnaz; Polian, Ilia; Sajadi, Abolfazl; Sauer, Mathias; Schwachhofer, Denis; SONZA REORDA, Matteo; Stefanov, Todor; Tuzov, Ilya; Wagner, Stefan; Zidaric, Nuša. - (2023), pp. 1-10. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (Italy) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174099]. 1-gen-2023 Riccardo CantoroNikolaos DeligiannisMatteo Sonza Reorda + ETS_RISC_V_testing_safety_security.pdfA_Survey_of_Recent_Developments_in_Testability_Safety_and_Security_of_RISC-V_Processors.pdf
Automatic Identification of Functionally Untestable Cell-Aware Faults in Microprocessors / Deligiannis, Nikolaos; Faller, Tobias; Iacopo, Guglielminetti; Cantoro, Riccardo; Becker, Bernd; SONZA REORDA, Matteo. - (2023), pp. 1-6. (Intervento presentato al convegno Asian Test Symposium (ATS) tenutosi a Beijing (China) nel 14-17 October 2023) [10.1109/ATS59501.2023.10317988]. 1-gen-2023 Nikolaos DeligiannisRiccardo CantoroMatteo Sonza Reorda + _ATS2023__Automatic_Identification_of_Functionally_Untestable_Cell_Aware_Faults_in_Microprocessors.pdfAutomatic_Identification_of_Functionally_Untestable_Cell-Aware_Faults_in_Microprocessors.pdf
Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing / Deligiannis, Nikolaos; Faller, Tobias; Chenghan, Zhou; Cantoro, Riccardo; Becker, Bernd; SONZA REORDA, Matteo. - (2023), pp. 1-5. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (Italy) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174232]. 1-gen-2023 Nikolaos DeligiannisRiccardo CantoroMatteo Sonza Reorda + _ETS2023__Automating_the_Generation_of_Functional_Stress_Inducing_Stimuli_for_Burn_In_Testing.pdfAutomating_the_Generation_of_Functional_Stress_Inducing_Stimuli_for_Burn-In_Testing.pdf
Enabling Inter-Product Transfer Learning on MCU Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - ELETTRONICO. - (2023), pp. 1-6. (Intervento presentato al convegno IEEE 32nd Asian Test Symposium tenutosi a Beijing (China) nel 14-17 October 2023) [10.1109/ATS59501.2023.10317992]. 1-gen-2023 Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + 2023_ATS_Transfer_Learning (4) (1).pdfEnabling_Inter-Product_Transfer_Learning_on_MCU_Performance_Screening.pdf
Feature Selection for Cost Reduction in MCU Performance Screening / Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - (2023), pp. 1-6. (Intervento presentato al convegno 24th IEEE Latin-American Test Symposium (LATS) tenutosi a Veracruz (MEX) nel 21-24 Marzo 2023) [10.1109/LATS58125.2023.10154495]. 1-gen-2023 Bellarmino, Nicolo'Cantoro, RiccardoSquillero, Giovanni + 2023_LATS_Feature_Selection.pdfFeature_Selection_for_Cost_Reduction_In_MCU_Performance_Screening.pdf
Functional Testing with STLs: A Step Towards Reliable RISC-V-based HPC Commodity Clusters / Rodriguez, Esteban; Deligiannis, Nikolaos; Sini, Jacopo; Cantoro, Riccardo; SONZA REORDA, Matteo. - 13999:(2023), pp. 444-457. (Intervento presentato al convegno ISC High Performance 2023 International Workshops tenutosi a Hamburg (DEU) nel May 21–25, 2023) [10.1007/978-3-031-40843-4_33]. 1-gen-2023 Esteban RodriguezNikolaos DeligiannisJacopo SiniRiccardo CantoroMatteo Sonza Reorda _RV_HPC2023__FULL_FORMAT__Functional_Testing_with_SLTs__A_step_towards_reliable_RISC_V_Based_HPC_commodity_clusters.pdf978-3-031-40843-4_33.pdf
Functional Testing with STLs: A Step Towards Reliable RISC-V-based HPC Commodity Clusters / Rodriguez Condia, Josie E.; Deligiannis, Nikolaos; Sini, Jacopo; Cantoro, Riccardo; SONZA REORDA, Matteo. - 13999:(2023), pp. 444-457. (Intervento presentato al convegno ISC High Performance 2023 International Workshops tenutosi a Hamburg (DEU) nel May 21–25, 2023) [10.1007/978-3-031-40843-4_33]. 1-gen-2023 Josie E. Rodriguez CondiaNikolaos DeligiannisJacopo SiniRiccardo CantoroMatteo Sonza Reorda _RV_HPC2023__FULL_FORMAT__Functional_Testing_with_SLTs__A_step_towards_reliable_RISC_V_Based_HPC_commodity_clusters.pdf978-3-031-40843-4_33.pdf
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems / Angione, Francesco; Bernardi, Paolo; Cantoro, Riccardo; Di Gruttola Giardino, Nicola; Piumatti, Davide; Reorda, Matteo Sonza; Appello, Davide; Tancorre, Vincenzo. - (2023), pp. 1-6. (Intervento presentato al convegno Latin American Test Symposium tenutosi a Veracruz (Mexico) nel 21-24 March 2023) [10.1109/LATS58125.2023.10154492]. 1-gen-2023 Angione, FrancescoBernardi, PaoloCantoro, RiccardoDi Gruttola Giardino, NicolaPiumatti, DavideReorda, Matteo Sonza + On_the_integration_and_hardening_of_Software_Test_Libraries_in_Real-Time_Operating_Systems.pdf
Semi-Supervised Deep Learning for Microcontroller Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venezia (IT) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174083]. 1-gen-2023 Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + 2023_ETS_Semi_Supersived_Learning (2).pdfSemi-Supervised_Deep_Learning_for_Microcontroller_Performance_Screening.pdf
U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration / Bellarmino, Nicolo’; Cantoro, Riccardo; Squillero, Giovanni. - ELETTRONICO. - (2023). (Intervento presentato al convegno The 9th International Conference on Machine Learning, Optimization, and Data Science (LOD 2023) tenutosi a Grasmere, Lake District, England – UK nel September 22 – 26, 2023). 1-gen-2023 Nicolo’ BellarminoRiccardo CantoroGiovanni Squillero 2023_LOD_Genetic_Feature_Selection (2).pdf
A comparative overview of ATPG flows targeting traditional and cell-aware fault models / Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza Reorda, Matteo. - ELETTRONICO. - (2022), pp. 1-4. (Intervento presentato al convegno 29th IEEE International Conference on Electronics Circuits and Systems (ICECS) tenutosi a Glasgow nel 24th - 26th October 2022) [10.1109/ICECS202256217.2022.9971003]. 1-gen-2022 Mirabella, NunzioFloridia, AndreaCantoro, RiccardoGrosso, MichelangeloSonza Reorda, Matteo ICECS_2022_1.2.pdfConference_paper_1.2_submitted.docxA_comparative_overview_of_ATPG_flows_targeting_traditional_and_cell-aware_fault_models.pdf
Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries / Cantoro, Riccardo; Garau, Francesco; Girard, Patrick; Kolahimahmoudi, Nima; Sartoni, Sandro; Reorda, Matteo Sonza; Virazel, Arnaud. - (2022), pp. 1-2. (Intervento presentato al convegno 2022 IEEE European Test Symposium tenutosi a Barcelona (SP) nel 23-27 Maggio 2022) [10.1109/ETS54262.2022.9810392]. 1-gen-2022 Cantoro, RiccardoGarau, FrancescoKolahimahmoudi, NimaSartoni, SandroReorda, Matteo Sonza + ETS22___Effective_techniques_for_automatically_improving_the_transition_delay_fault_coverage_of_Self_Test_Libraries.pdfEffective_techniques_for_automatically_improving_the_transition_delay_fault_coverage_of_Self-Test_Libraries.pdf
Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries / Cantoro, Riccardo; Garau, Francesco; Masante, Riccardo; Sartoni, Sandro; Singh, Virendra; Reorda, Matteo Sonza. - (2022), pp. 1-7. (Intervento presentato al convegno 2022 IEEE 40th VLSI Test Symposium (VTS) tenutosi a San Diego (USA) nel 25-27 Aprile 2022) [10.1109/VTS52500.2021.9794219]. 1-gen-2022 Cantoro, RiccardoGarau, FrancescoMasante, RiccardoSartoni, SandroReorda, Matteo Sonza + VTS22___Exploiting_post_silicon_debug_hardware_to_improve_the_fault_coverage_of_Software_Test_Libraries__CAMERA_READY_.pdfExploiting_post-silicon_debug_hardware_to_improve_the_fault_coverage_of_Software_Test_Libraries.pdf
Improving the Fault Resilience of Neural Network Applications Through Security Mechanisms / Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Traiola, Marcello; Valea, Emanuele. - (2022), pp. 23-24. (Intervento presentato al convegno Dependable Systems and Networks nel 27-30 June 2022) [10.1109/DSN-S54099.2022.00017]. 1-gen-2022 Nikolaos DeligiannisRiccardo CantoroMatteo Sonza ReordaEmanuele Valea + DSN_2022.pdfImproving_the_Fault_Resilience_of_Neural_Network_Applications_Through_Security_Mechanisms.pdf
Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data / Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - (2022). (Intervento presentato al convegno IEEE International Symposium on On-Line Testing and Robust System 2022 tenutosi a Torino nel 12-14 September 2022) [10.1109/IOLTS56730.2022.9897769]. 1-gen-2022 Bellarmino,Nicolo'Cantoro,RiccardoSquillero,Giovanni + Microcontroller_Performance_Screening_Optimizing_the_Characterization_in_the_Presence_of_Anomalous_and_Noisy_Data.pdf2022_IOLTS_Outlier_Detection_.pdf
Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip / Bernardi, Paolo; Insinga, Giorgio; Paganini, Giovanni; Cantoro, Riccardo; Beer, Peter; Mautone, Nellina; Scaramuzza, Pierre; Carnevale, Giambattista; Coppetta, Matteo; Ullmann, Rudolf. - (2022), pp. 1-6. (Intervento presentato al convegno IEEE European Test Symposium tenutosi a Barcelona (Spain) nel 23-27 May 2022) [10.1109/ETS54262.2022.9810445]. 1-gen-2022 Paolo BERNARDIGiorgio INSINGAGiovanni PAGANINIRiccardo CANTORO + Optimized_diagnostic_strategy_for_embedded_memories_of_Automotive_Systems-on-Chip.pdf
Recent Trends and Perspectives on Defect-Oriented Testing / Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; Gielen, G.; Gomez, J.; Grosso, M.; Guerriero, A. M.; Guglielminetti, I.; Hamdioui, S.; Insinga, G.; Mautone, N.; Mirabella, N.; Sartoni, S.; Sonza Reorda, M.; Ullmann, R.; Vanhooren, R.; Xama, N.; Wu, L.. - (2022). (Intervento presentato al convegno The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Torino (Italy) nel 12-14 September 2022) [10.1109/IOLTS56730.2022.9897647]. 1-gen-2022 P. BernardiR. CantoroA. FloridiaM. GrossoS. HamdiouiG. InsingaN. MirabellaS. SartoniM. Sonza ReordaL. Wu + _IOLTS2022__Special_Session__Recent_Trends_and_Perspectives_on_Defect_Oriented_Testing.pdfRecent_Trends_and_Perspectives_on_Defect-Oriented_Testing.pdf